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Surface distributions of two level system (TLS) defects and magnetic vortices are limiting dissipation sources in superconducting quantum circuits. Arrays of flux-trapping holes are commonly used to eliminate loss due to magnetic vortices, but may increase dielectric TLS loss. We find that dielectric TLS loss increases by approximately 25% for resonators with a hole array beginning 2 $mu text{m}$ from the resonator edge, while the dielectric loss added by holes further away was below measurement sensitivity. Other forms of loss were not affected by the holes. Additionally, we estimate the loss due to residual magnetic effects to be $9times 10^{-10} /mutext{T} $ for resonators patterned with flux-traps and operated in magnetic fields up to $5$ $mutext{T}$. This is orders of magnitude below the total loss of the best superconducting coplanar waveguide resonators.
The investigation of two-level-state (TLS) loss in dielectric materials and interfaces remains at the forefront of materials research in superconducting quantum circuits. We demonstrate a method of TLS loss extraction of a thin film dielectric by mea
We present microwave-frequency NbTiN resonators on silicon, systematically achieving internal quality factors above 1 M in the quantum regime. We use two techniques to reduce losses associated with two-level systems: an additional substrate surface t
The temperature and field dependences of the trapped magnetic fields and of the frozen magnetoresistance of (Pb)Bi-Sr-Ca-Cu-O ceramics and Bi-based magnetron films are investigated. It is found that in the resistive transition region of granular Bi-H
Thin films of TiN were sputter-deposited onto Si and sapphire wafers with and without SiN buffer layers. The films were fabricated into RF coplanar waveguide resonators, and internal quality factor measurements were taken at millikelvin temperatures
Losses in superconducting planar resonators are presently assumed to predominantly arise from surface-oxide dissipation, due to experimental losses varying with choice of materials. We model and simulate the magnitude of the loss from interface surfa