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تسجيل مستخدم جديدWhy graphene growth is very different on the C face than on the Si face of SiC: Insights from surface equilibria and the (3$times$3)-3C-SiC($bar{text{1}}bar{text{1}}bar{text{1}}$) reconstruction
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We address the stability of the surface phases that occur on the C-side of 3C-SiC($bar{1} bar{1} bar{1}$) at the onset of graphene formation. In this growth range, experimental reports reveal a coexistence of several surface phases. This coexistence can be explained by a Si-rich model for the unknown (3$times$3) reconstruction, the known (2$times$2)$_{C}$ adatom phase, and the graphene covered (2$times$2)$_{C}$ phase. By constructing an $ab$ $initio$ surface phase diagram using a van der Waals corrected density functional, we show that the formation of a well defined interface structure like the buffer-layer on the Si side is blocked by Si-rich surface reconstructions.
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Silicon carbide (SiC) is an excellent substrate for growth and manipulation of large scale, high quality epitaxial graphene. On the carbon face (the ($bar{1}bar{1}bar{1}$) or $(000bar{1}$) face, depending on the polytype), the onset of graphene growt
h is intertwined with the formation of several competing surface phases, among them a (3$times$3) precursor phase suspected to hinder the onset of controlled, near-equilibrium growth of graphene. Despite more than two decades of research, the precise atomic structure of this phase is still unclear. We present a new model of the (3$times$3)-SiC-($bar{1}bar{1}bar{1}$) reconstruction, derived from an {it ab initio} random structure search based on density functional theory including van der Waals effects. The structure consists of a simple pattern of five Si adatoms in bridging and on-top positions on an underlying, C-terminated substrate layer, leaving one C atom per (3$times$3) unit cell formally unsaturated. Simulated scanning tunneling microscopy (STM) images are in excellent agreement with previously reported experimental STM images.
Growth of epitaxial graphene on the C-face of SiC has been investigated. Using a confinement controlled sublimation (CCS) method, we have achieved well controlled growth and been able to observe propagation of uniform monolayer graphene. Surface patt
erns uncover two important aspects of the growth, i.e. carbon diffusion and stoichiometric requirement. Moreover, a new stepdown growth mode has been discovered. Via this mode, monolayer graphene domains can have an area of hundreds of square micrometers, while, most importantly, step bunching is avoided and the initial uniformly stepped SiC surface is preserved. The stepdown growth provides a possible route towards uniform epitaxial graphene in wafer size without compromising the initial flat surface morphology of SiC.
The morphology of graphene on SiC {0001} surfaces formed in various environments including ultra-high vacuum, 1 atm of argon, and 10^-6 to 10^-4 Torr of disilane is studied by atomic force microscopy, low-energy electron microscopy, and Raman spectro
scopy. The graphene is formed by heating the surface to 1100 - 1600 C, which causes preferential sublimation of the Si atoms. The argon atmosphere or the background of disilane decreases the sublimation rate so that a higher graphitization temperature is required, thus improving the morphology of the films. For the (0001) surface, large areas of monolayer-thick graphene are formed in this way, with the size of these areas depending on the miscut of the sample. Results on the (000-1) surface are more complex. This surface graphitizes at a lower temperature than for the (0001) surface and consequently the growth is more three-dimensional. In an atmosphere of argon the morphology becomes even worse, with the surface displaying markedly inhomogeneous nucleation, an effect attributed to unintentional oxidation of the surface during graphitization. Use of a disilane environment for the (000-1) surface is found to produce improved morphology, with relatively large areas of monolayer-thick graphene.
We perform density functional theory calculations for the determination of the structural and electronic properties of epitaxial graphene on 4H-SiC(000$bar{1}$). Using commensurate supercells that minimize non-physical stresses we show that, in contr
ast with Si-face epitaxial films, the first graphene layer that forms on the C-face of SiC is purely metallic with its $pi$-bands partially preserved. Typical free-standing characteristics are fully recovered with a second graphene layer. We moreover discuss on the magnetic properties of the interface and the absence of Fermi-level pinning effects that could allow for a plausible device operation starting from the off-state.
The structure of the SiC(000-1) surface, the C-face of the {0001} SiC surfaces, is studied as a function of temperature and of pressure in a gaseous environment of disilane (Si2H6). Various surface reconstructions are observed, both with and without
the presence of an overlying graphene layer (which spontaneously forms at sufficiently high temperatures). Based on cross-sectional scanning transmission electron microscopy measurements, the interface structure that forms in the presence of the graphene is found to contain 1.4 - 1.7 monolayers (ML) of Si, a somewhat counter-intuitive result since, when the graphene forms, the system is actually under C-rich conditions. Using ab initio thermodynamics, it is demonstrated that there exists a class of Si-rich surfaces containing about 1.3 ML of Si that are stable on the surface (even under C-rich conditions) at temperatures above about 400 K. The structures that thus form consist of Si adatoms atop a Si adlayer on the C-face of SiC, with or without the presence of overlying graphene.
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