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تسجيل مستخدم جديدLow resource FPGA-based Time to Digital Converter
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Time to Digital Converters (TDCs) are very common devices in particles physics experiments. A lot of off-the-shelf TDCs can be employed but the necessity of a custom DAta acQuisition (DAQ) system makes the TDCs implemented on the Field-Programmable Gate Arrays (FPGAs) desirable. Most of the architectures developed so far are based on the tapped delay lines with precision down to 10 ps, obtained with high FPGA resources usage and non-linearity issues to be managed. Often such precision is not necessary; in this case TDC architectures with low resources occupancy are preferable allowing the implementation of data processing systems and of other utilities on the same device. In order to reconstruct gamma-gamma physics events tagged with High Energy Tagger (HET) in the KLOE-2 (K LOng Experiment 2), we need to measure the Time Of Flight (TOF) of the electrons and positrons from the KLOE-2 Interaction Point (IP) to our tagging stations (11 m apart). The required resolution must be better than the bunch spacing (2.7 ns). We have developed and implemented on a Xilinx Virtex-5 FPGA a 32 channel TDC with a precision of 255 ps and low non-linearity effects along with an embedded data acquisition systems and the interface to the online FARM of KLOE-2.
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In order to reconstruct gamma-gamma physics events tagged with High Energy Tagger (HET) in the KLOE-2 (K LOng Experiment 2), we need to measure the Time Of Flight (TOF) of the electrons and positrons from the KLOE-2 Interaction Point (IP) to our tagg
ing stations (11 m apart). The required resolution must be better than the bunch spacing (2.7 ns). We have developed and implemented on a Xilinx Virtex-5 FPGA a Time to Digital Converter (TDC) with 625 ps resolution (LSB) along with an embedded data acquisition system and the interface to the online FARM of KLOE-2. We will describe briefly the architecture of the TDC and of the Data AcQuisition (DAQ) system. Some more details will be provided about the zero-suppression algorithm used to reduce the data throughput.
Time-to-digital converters (TDCs) are used in various fields, including high-energy physics. One advantage of implementing TDCs in field-programmable gate arrays (FPGAs) is the flexibility on the modification of the logics, which is useful to cope wi
th the changes in the experimental conditions. Recent FPGAs make it possible to implement TDCs with a time resolution less than 10 ps. On the other hand, various drift chambers require a time resolution of O(0.1) ns, and a simple and easy-to-implement TDC is useful for a robust operation. Herein an eight-channel TDC with a variable bin size down to 0.28 ns is implemented in a Xilinx Kintex-7 FPGA and tested. The TDC is based on a multisampling scheme with quad phase clocks synchronised with an external reference clock. Calibration of the bin size is unnecessary if a stable reference clock is available, which is common in high-energy physics experiments. Depending on the channel, the standard deviation of the differential nonlinearity for a 0.28 ns bin size is 0.13-0.31. The performance has a negligible dependence on the temperature. The power consumption and the potential to extend the number of channels are also discussed.
We present some aspects of photon counting to study scintillators at low temperatures. A time-to-digital converter (TDC) had been configured to acquire several-minute-long streams of data, simplifying the multiple photon counting coincidence techniqu
e. Results in terms of light yield and time structure of a ZnWO4 scintillator are comparable to those obtained with a fast digitizer. Streaming data also provides flexibility in analyzing the data, in terms of coincidence window between the channels, and acquisition window of individual channels. We discuss the effect of changing these parameters, and use them to confirm low-energy features in the spectra of the number of detected photons, such as the 60 keV line from 241Am in the ZnWO4 sample. We lastly use the TDC to study the transmission of the optical cryostat employed in these studies at various temperatures.
A high-precision charge measurement can be achieved by the area integration of a digitized quasi-Gaussian signal after the signal passes through the shaper and analog-to-digital converter (ADC). The charge measurement contains an error due to the unc
ertainty of the first sampled point of a signal waveform. To reduce the error, we employ a time-to-digital converter (TDC) to measure the uncertainty precisely, and we design correction algorithms to improve the resolution of the charge measurement. This work includes analysis and simulations of the proposed algorithms and implementation of them in an FPGA device. Besides, the tests are also conducted to evaluate the performance of the correction method. Test results indicate that the resolution of the charge measurement is successfully improved from 0.231% to 0.126% by using a signal from the shaping circuit (with the amplitude of 2 V, and leading and trailing edges of about 80 ns and 280 ns, respectively) digitized at the sampling rate of 62.5 Msps.
We present the design and test results of a Time-to-Digital-Converter (TDC). The TDC will be a part of the readout ASIC, called ETROC, to read out Low-Gain Avalanche Detectors (LGADs) for the CMS Endcap Timing Layer (ETL) of High-Luminosity LHC upgra
de. One of the challenges of the ETROC design is that the TDC is required to consume less than 200 W for each pixel at the nominal hit occupancy of 1%. To meet the low-power requirement, we use a single delay line for both the Time of Arrival (TOA) and the Time over Threshold (TOT) measurements without delay control. A double-strobe self-calibration scheme is used to compensate for process variation, temperature, and power supply voltage. The TDC is fabricated in a 65 nm CMOS technology. The overall performances of the TDC have been evaluated. The TOA has a bin size of 17.8 ps within its effective dynamic range of 11.6 ns. The effective measurement precision of the TOA is 5.6 ps and 9.9 ps with and without the nonlinearity correction, respectively. The TDC block consumes 97 W at the hit occupancy of 1%. Over a temperature range from 23 C to 78 C and a power supply voltage range from 1.05 V to 1.35 V (the nominal value of 1.20 V), the self-calibrated bin size of the TOA varies within 0.4%. The measured TDC performances meet the requirements except that more tests will be performed in the future to verify that the TDC complies with the radiation-tolerance specifications.
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