ﻻ يوجد ملخص باللغة العربية
Several methods, known as Quantum Process Tomography, are available to characterize the evolution of quantum systems, a task of crucial importance. However, their complexity dramatically increases with the size of the system. Here we present the theory describing a new type of method for quantum process tomography. We describe an algorithm that can be used to selectively estimate any parameter characterizing a quantum process. Unlike any of its predecessors this new quantum tomographer combines two main virtues: it requires investing a number of physical resources scaling polynomially with the number of qubits and at the same time it does not require any ancillary resources. We present the results of the first photonic implementation of this quantum device, characterizing quantum processes affecting two qubits encoded in heralded single photons. Even for this small system our method displays clear advantages over the other existing ones.
We present the results of the first photonic implementation of a new method for quantum process tomography. The method (originally presented by A. Bendersky et al, Phys. Rev. Lett 100, 190403 (2008)) enables the estimation of any element of the chi-m
The accurate and reliable characterization of quantum dynamical processes underlies efforts to validate quantum technologies, where discrimination between competing models of observed behaviors inform efforts to fabricate and operate qubit devices. W
The standard method of Quantum State Tomography (QST) relies on the measurement of a set of noncommuting observables, realized in a series of independent experiments. Ancilla Assisted QST (AAQST) proposed by Nieuwenhuizen and co-workers (Phys. Rev. L
Quantum process tomography is an experimental technique to fully characterize an unknown quantum process. Standard quantum process tomography suffers from exponentially scaling of the number of measurements with the increasing system size. In this wo
Quantum process tomography is a necessary tool for verifying quantum gates and diagnosing faults in architectures and gate design. We show that the standard approach of process tomography is grossly inaccurate in the case where the states and measure