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We report the first direct observation of the oxygen-isotope ($^{16}$O/$^{18}$O) effect on the in-plane penetration depth $lambda_{ab}$ in a nearly optimally doped YBa$_2$Cu$_3$O$_{7-delta}$ film using the novel low-energy muon-spin rotation technique. Spin polarized low energy muons are implanted in the film at a known depth $z$ beneath the surface and precess in the local magnetic field $B(z)$. This feature allows us to measure directly the profile $B(z)$ of the magnetic field inside the superconducting film in the Meissner state and to make a model independent determination of $lambda_{ab}$. A substantial isotope shift $Deltalambda_{ab}/lambda_{ab}=2.8(7)$% at 4 K is observed, implying that the in-plane effective supercarrier mass $m_{ab}^ast$ is oxygen-isotope dependent with $Delta m_{ab}^ast/m_{ab}^ast = 5.5(1.4)%$.
We reveal that the temperature dependence of the basal-plane normal-state electrical resistance of optimally doped YBa$_2$Cu$_3$O$_{7-delta}$ single crystals can be with great accuracy approximated within the framework of the model of s-d electron-ph
Muon-spin rotation (muSR) studies of the oxygen isotope (^{16}O/^{18}O) effect (OIE) on the in-plane magnetic field penetration depth lambda_{ab} in cuprate high-temperature superconductors (HTS) are presented. First, the doping dependence of the OIE
Most measurements of critical current densities in YBa$_2$Cu$_3$O$_{7-delta}$ thin films to date have been performed on films where the textit{c}-axis is grown normal to the film surface. With such films, the analysis of the dependence of $j_c$ on th
An unusual noise component is found near and below about 250 K in the normal state of underdoped YBCO and Ca-YBCO films. This noise regime, unlike the more typical noise above 250 K, has features expected for a symmetry-breaking collective electronic
The temperature and field dependence of reversible magnetization have been measured on a YBa$_2$Cu$_3$O$_{7-delta}$ single crystal at six different doping concentrations. It is found that the data above 2 T can be described by the scaling law based o