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The soft error rate (SER) of integrated circuits (ICs) operating in space environment may vary by several orders of magnitude due to the variable intensity of radiation exposure. To ensure the radiation hardness without compromising the system performance, it is necessary to implement the dynamic hardening mechanisms which can be activated under the critical radiation exposure. Such operating scenario requires the real-time detection of energetic particles responsible for the soft errors. Although numerous particle detection solutions have been reported, very few works address the on-chip particle detectors suited for the self-adaptive fault tolerant microprocessor systems for space missions. This work reviews the state-of-the-art particle detectors, with emphasis on two solutions for the self-adaptive systems: particle detector based on embedded SRAM and particle detector based on pulse stretching inverters.
Robustness and reliability are two key requirements for developing practical quantum control systems. The purpose of this paper is to design a coherent feedback controller for a class of linear quantum systems suffering from Markovian jumping faults
I review the transfer of technology from accelerator-based equipment to space-borne astroparticle detectors. Requirements for detection, identification and measurement of ions, electrons and photons in space are recalled. The additional requirements
This paper deals with the fault detection and isolation (FDI) problem for linear structured systems in which the system matrices are given by zero/nonzero/arbitrary pattern matrices. In this paper, we follow a geometric approach to verify solvability
The paper reviews recent progress in particle identification methods. A survey of motivations and requirements for particle identification in various experimental environments is followed by the main emphasis, which is on the recent development of Ch
We briefly review the concept and properties of the Thick GEM (THGEM); it is a robust, high-gain gaseous electron multiplier, manufactured economically by standard printed-circuit drilling and etching technology. Its operation and structure resemble