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The two-dimensional principal component analysis (2DPCA) has become one of the most powerful tools of artificial intelligent algorithms. In this paper, we review 2DPCA and its variations, and propose a general ridge regression model to extract features from both row and column directions. To enhance the generalization ability of extracted features, a novel relaxed 2DPCA (R2DPCA) is proposed with a new ridge regression model. R2DPCA generates a weighting vector with utilizing the label information, and maximizes a relaxed criterion with applying an optimal algorithm to get the essential features. The R2DPCA-based approaches for face recognition and image reconstruction are also proposed and the selected principle components are weighted to enhance the role of main components. Numerical experiments on well-known standard databases indicate that R2DPCA has high generalization ability and can achieve a higher recognition rate than the state-of-the-art methods, including in the deep learning methods such as CNNs, DBNs, and DNNs.
A sample-relaxed two-dimensional color principal component analysis (SR-2DCPCA) approach is presented for face recognition and image reconstruction based on quaternion models. A relaxation vector is automatically generated according to the variances
A generalized two-dimensional quaternion principal component analysis (G2DQPCA) approach with weighting is presented for color image analysis. As a general framework of 2DQPCA, G2DQPCA is flexible to adapt different constraints or requirements by imp
A relaxed two dimensional principal component analysis (R2DPCA) approach is proposed for face recognition. Different to the 2DPCA, 2DPCA-$L_1$ and G2DPCA, the R2DPCA utilizes the label information (if known) of training samples to calculate a relaxat
Randomized algorithms provide solutions to two ubiquitous problems: (1) the distributed calculation of a principal component analysis or singular value decomposition of a highly rectangular matrix, and (2) the distributed calculation of a low-rank ap
Cryo-electron microscopy nowadays often requires the analysis of hundreds of thousands of 2D images as large as a few hundred pixels in each direction. Here we introduce an algorithm that efficiently and accurately performs principal component analys