اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدSingle frame wide-field Nanoscopy based on Ghost Imaging via Sparsity Constraints (GISC Nanoscopy)
303
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
The applications of present nanoscopy techniques for live cell imaging are limited by the long sampling time and low emitter density. Here we developed a new single frame wide-field nanoscopy based on ghost imaging via sparsity constraints (GISC Nanoscopy), in which a spatial random phase modulator is applied in a wide-field microscopy to achieve random measurement for fluorescence signals. This new method can effectively utilize the sparsity of fluorescence emitters to dramatically enhance the imaging resolution to 80 nm by compressive sensing (CS) reconstruction for one raw image. The ultra-high emitter density of 143 {mu}m-2 has been achieved while the precision of single-molecule localization below 25 nm has been maintained. Thereby working with high-density of photo-switchable fluorophores GISC nanoscopy can reduce orders of magnitude sampling frames compared with previous single-molecule localization based super-resolution imaging methods.
قيم البحث
اقرأ أيضاً
The image information acquisition ability of a conventional camera is usually much lower than the Shannon Limit since it does not make use of the correlation between pixels of image data. Applying a random phase modulator to code the spectral images
and combining with compressive sensing (CS) theory, a spectral camera based on true thermal light ghost imaging via sparsity constraints (GISC spectral camera) is proposed and demonstrated experimentally. GISC spectral camera can acquire the information at a rate significantly below the Nyquist rate, and the resolution of the cells in the three-dimensional (3D) spectral images data-cube can be achieved with a two-dimensional (2D) detector in a single exposure. For the first time, GISC spectral camera opens the way of approaching the Shannon Limit determined by Information Theory in optical imaging instruments.
For remote sensing, high-resolution imaging techniques are helpful to catch more characteristic information of the target. We extend pseudo-thermal light ghost imaging to the area of remote imaging and propose a ghost imaging lidar system. For the fi
rst time, we demonstrate experimentally that the real-space image of a target at about 1.0 km range with 20 mm resolution is achieved by ghost imaging via sparsity constraints (GISC) technique. The characters of GISC technique compared to the existing lidar systems are also discussed.
Linear super-resolution microscopy via synthesis aperture approach permits fast acquisition because of its wide-field implementations, however, it has been limited in resolution because a missing spatial-frequency band occurs when trying to use a shi
ft magnitude surpassing the cutoff frequency of the detection system beyond a factor of two, which causes ghosting to appear. Here, we propose a method of chip-based 3D nanoscopy through large and tunable spatial-frequency-shift effect, capable of covering full extent of the spatial-frequency component within a wide passband. The missing of spatial-frequency can be effectively solved by developing a spatial-frequency-shift actively tuning approach through wave vector manipulation and operation of optical modes propagating along multiple azimuthal directions on a waveguide chip to interfere. In addition, the method includes a chip-based sectioning capability, which is enabled by saturated absorption of fluorophores. By introducing ultra-large propagation effective refractive index, nanoscale resolution is possible, without sacrificing the temporal resolution and the field-of-view. Imaging on GaP waveguide material demonstrates a lateral resolution of lamda/10, which is 5.4 folds above Abbe diffraction limit, and an axial resolution of lamda/19 using 0.9 NA detection objective. Simulation with an assumed propagation effective refractive index of 10 demonstrates a lateral resolution of lamda/22, in which the huge gap between the directly shifted and the zero-order components is completely filled to ensure the deep-subwavelength resolvability. It means that, a fast wide-field 3D deep-subdiffraction visualization could be realized using a standard microscope by adding a mass-producible and cost-effective spatial-frequency-shift illumination chip.
Scattering-type scanning near-field microscopy (s-SNOM) at terahertz (THz) frequencies could become a highly valuable tool for studying a variety of phenomena of both fundamental and applied interest, including mobile carrier excitations or phase tra
nsitions in 2D materials or exotic conductors. Applications, however, are strongly challenged by the limited signal to noise ratio. One major reason is that standard atomic force microscope (AFM) tips, which have made s-SNOM a highly practical and rapidly emerging tool, provide weak scattering efficiencies at THz frequencies. Here we report a combined experimental and theoretical study of commercial and custom-made AFM tips of different apex diameter and length, in order to understand signal formation in THz s-SNOM and to provide insights for tip optimization. Contrary to common beliefs, we find that AFM tips with large (micrometer-scale) apex diameter can enhance s-SNOM signals by more than one order of magnitude, while still offering a spatial resolution of about 100 nm at a wavelength of 119 micron. On the other hand, exploiting the increase of s-SNOM signals with tip length, we succeeded in sub-15 nm resolved THz imaging employing a tungsten tip with 6 nm apex radius. We explain our findings and provide novel insights into s-SNOM via rigorous numerical modeling of the near-field scattering process. Our findings will be of critical importance for pushing THz nanoscopy to its ultimate limits regarding sensitivity and spatial resolution.
Total internal reflection fluorescence microscopy (TIRF) has enabled low-background, live-cell friendly imaging of cell surfaces and other thin samples thanks to the shallow penetration of the evanescent light field into the sample. The implementatio
n of TIRF on optical waveguide chips (c-TIRF) has overcome historical limitations on the magnification and field of view (FOV) compared to lens-based TIRF, and further allows the light to be guided in complicated patterns that can be used for advanced imaging techniques or selective stimulation of the sample. However, the opacity of the chips themselves has thus far precluded their use on inverted microscopes and complicated sample preparation and handling. In this work, we introduce a new platform for c-TIRF imaging based on a transparent substrate, which is fully compatible with sample handling and imaging procedures commonly used with a standard #1.5 glass coverslip, and is fabricated using standard complementary metal-oxide-semiconductor (CMOS) techniques, which can easily be scaled up for mass production. We demonstrate its performance on synthetic and biological samples using both upright and inverted microscopes, and show how it can be extended to super-resolution applications, achieving a resolution of 116 nm using super resolution radial fluctuations (SRRF). These new chips retain the scalable FOV of opaque chip-based TIRF and the high axial resolution of TIRF, and have the versatility to be used with many different objective lenses, microscopy methods, and handling techniques. We thus see c-TIRF as a technology primed for widespread adoption, increasing both TIRFs accessibility to users and the range of applications that can benefit from it.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
