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Twisted bilayer graphene with a twist angle of around 1.1{deg} features a pair of isolated flat electronic bands and forms a strongly correlated electronic platform. Here, we use scanning tunneling microscopy to probe local properties of highly tunable twisted bilayer graphene devices and show that the flat bands strongly deform when aligned with the Fermi level. At half filling of the bands, we observe the development of gaps originating from correlated insulating states. Near charge neutrality, we find a previously unidentified correlated regime featuring a substantially enhanced flat band splitting that we describe within a microscopic model predicting a strong tendency towards nematic ordering. Our results provide insights into symmetry breaking correlation effects and highlight the importance of electronic interactions for all filling factors in twisted bilayer graphene.
Fractional Chern insulators (FCIs) are lattice analogues of fractional quantum Hall states that may provide a new avenue toward manipulating non-abelian excitations. Early theoretical studies have predicted their existence in systems with energetical
In the past two years, magic-angle twisted bilayer graphene has emerged as a uniquely versatile experimental platform that combines metallic, superconducting, magnetic and insulating phases in a single crystal. In particular the ability to tune the s
Magic-angle twisted bilayer graphene (MtBLG) has proven to be an extremely promising new platform to realize and study a host of emergent quantum phases arising from the strong correlations in its narrow bandwidth flat band. In this regard, thermal t
Interactions among electrons and the topology of their energy bands can create novel quantum phases of matter. Most topological electronic phases appear in systems with weak electron-electron interactions. The instances where topological phases emerg
Using the semiclassical quantum Boltzmann theory and employing the Dirac model with twist angle-dependent Fermi velocity we obtain results for the electrical resistivity, the electronic thermal resistivity, the Seebeck coefficient, and the Wiedemann-