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Coherent X-ray beams with energies $geq 50$ keV can potentially enable three-dimensional imaging of atomic lattice distortion fields within individual crystallites in bulk polycrystalline materials through Bragg coherent diffraction imaging (BCDI). However, the undersampling of the diffraction signal due to Fourier space compression at high X-ray energies renders conventional phase retrieval algorithms unsuitable for three-dimensional reconstruction. To address this problem we utilize a phase retrieval method with a Fourier constraint specifically tailored for undersampled diffraction data measured with coarse-pitched detector pixels that bin the underlying signal. With our approach, we show that it is possible to reconstruct three-dimensional strained crystallites from an undersampled Bragg diffraction data set subject to pixel-area integration without having to physically upsample the diffraction signal. Using simulations and experimental results, we demonstrate that explicit modeling of Fourier space compression during phase retrieval provides a viable means by which to invert high-energy BCDI data, which is otherwise intractable.
Unique intensity features arising from dynamical diffraction arise in coherent x-ray nanobeam diffraction patterns of crystals having thicknesses larger than the x-ray extinction depth or exhibiting combinations of nanoscale and mesoscale features. W
Coherent X-ray photons with energies higher than 50 keV offer new possibilities for imaging nanoscale lattice distortions in bulk crystalline materials using Bragg peak phase retrieval methods. However, the compression of reciprocal space at high ene
By using phase retrieval, Bragg Coherent Diffractive Imaging (BCDI) allows tracking of three-dimensional displacement fields inside individual nanocrystals. Nevertheless, in the presence of significant (1% and higher) strains, such as in the process
Focused ion beam (FIB) techniques are commonly used to machine, analyse and image materials at the micro- and nanoscale. However, FIB modifies the integrity of the sample by creating defects that cause lattice distortions. Methods have been developed
X-ray Bragg coherent diffraction imaging has been demonstrated as a powerful three-dimensional (3D) microscopy approach for the investigation of sub-micrometer-scale crystalline particles. It is based on the measurement of a series of coherent diffra