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تسجيل مستخدم جديدImaging and spectral performance of CdTe double-sided strip detectors for the Hard X-ray Imager onboard ASTRO-H
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The imaging and spectral performance of CdTe double-sided strip detectors (CdTe-DSDs) was evaluated for the ASTRO-H mission. The charcterized CdTe-DSDs have a strip pitch of 0.25 mm, an imaging area of 3.2 cm$times$3.2 cm and a thickness of 0.75 mm. The detector was successfully operated at a temperature of $-20^circ$C and with an applied bias voltage of 250 V. By using two-strip events as well as one-strip events for the event reconstruction, a good energy resolution of 2.0 keV at 59.5 keV and a sub-strip spatial resolution was achieved. The hard X-ray and gamma-ray response of CdTe-DSDs is complex due to the properties of CdTe and the small pixel effect. Therefore, one of the issues to investigate is the response of the CdTe-DSD. In order to investigate the spatial dependence of the detector response, we performed fine beam scan experiments at SPring-8, a synchrotron radiation facility. From these experiments, the depth structure of the electric field was determined as well as properties of carriers in the detector and successfully reproduced the experimental data with simulated spectra.
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The Hard X-ray Imager (HXI) onboard Hitomi (ASTRO-H) is an imaging spectrometer covering hard X-ray energies of 5-80 keV. Combined with the hard X-ray telescope, it enables imaging spectroscopy with an angular resolution of $1^prime.7$ half-power dia
meter, in a field of view of $9^primetimes9^prime$. The main imager is composed of 4 layers of Si detectors and 1 layer of CdTe detector, stacked to cover wide energy band up to 80 keV, surrounded by an active shield made of BGO scintillator to reduce the background. The HXI started observations 12 days before the Hitomi loss, and successfully obtained data from G21.5$-$0.9, Crab and blank sky. Utilizing these data, we calibrate the detector response and study properties of in-orbit background. The observed Crab spectra agree well with a powerlaw model convolved with the detector response, within 5% accuracy. We find that albedo electrons in specified orbit strongly affect the background of Si top layer, and establish a screening method to reduce it. The background level over the full field of view after all the processing and screening is as low as the pre-flight requirement of $1$-$3times10^{-4}$ counts s$^{-1}$ cm$^{-2}$ keV$^{-1}$.
We have evaluated the performance of a fine pitch CdTe Double-sided Strip Detector (CdTe-DSD), which was originally developed for the focal plane detector of a hard X-ray telescope to observe the Sun. The detector has a thickness of 750 um and has 12
8 strip electrodes with a 60 um strip pitch orthogonally placed on both sides of the detector and covers an energy range 4 keV to 80 keV. The study of the depth of photon interaction and charge sharing effects are of importance in order to provide good spectroscopic and imaging performance. We study the tail structure observed in the spectra caused by charge trapping and develop a new method to reconstruct the spectra based on induced charge information from both anode and cathode strips. By applying this method, energy resolutions (FWHM) of 0.76 keV and 1.0 keV can be obtained at photon energies of 14 keV and 60 keV, respectively, if the energy difference between the anode and cathode is within 1 keV. Furthermore, the tail component at 60 keV is reduced, and the energy resolution of the 60 keV peak is improved from 2.4 keV to 1.5 keV (FWHM) if the energy difference is greater than 1 keV. In order to study the imaging performance, we constructed a simple imaging system using a 5 mm thick tungsten plate that has a pinhole with a diameter of 100 um. We utilize a Ba-133 radioisotope of 1 mm in diameter as a target source in combination with a 100 um slit made from 0.5 mm thickness tungsten. We imaged the Ba-133 source behind the 100 um slit using a 30 keV peak, with a 100 um pinhole placed at the center of the source-detector distance. By applying a charge sharing correction between strips, we have succeeded in obtaining a position resolution better than the strip pitch of 60 um.
The Soft Gamma-ray Detector (SGD) is one of the instrument payloads onboard ASTRO-H, and will cover a wide energy band (60--600 keV) at a background level 10 times better than instruments currently in orbit. The SGD achieves low background by combini
ng a Compton camera scheme with a narrow field-of-view active shield. The Compton camera in the SGD is realized as a hybrid semiconductor detector system which consists of silicon and cadmium telluride (CdTe) sensors. The design of the SGD Compton camera has been finalized and the final prototype, which has the same configuration as the flight model, has been fabricated for performance evaluation. The Compton camera has overall dimensions of 12 cm x 12 cm x 12 cm, consisting of 32 layers of Si pixel sensors and 8 layers of CdTe pixel sensors surrounded by 2 layers of CdTe pixel sensors. The detection efficiency of the Compton camera reaches about 15% and 3% for 100 keV and 511 keV gamma rays, respectively. The pixel pitch of the Si and CdTe sensors is 3.2 mm, and the signals from all 13312 pixels are processed by 208 ASICs developed for the SGD. Good energy resolution is afforded by semiconductor sensors and low noise ASICs, and the obtained energy resolutions with the prototype Si and CdTe pixel sensors are 1.0--2.0 keV (FWHM) at 60 keV and 1.6--2.5 keV (FWHM) at 122 keV, respectively. This results in good background rejection capability due to better constraints on Compton kinematics. Compton camera energy resolutions achieved with the final prototype are 6.3 keV (FWHM) at 356 keV and 10.5 keV (FWHM) at 662 keV, respectively, which satisfy the instrument requirements for the SGD Compton camera (better than 2%). Moreover, a low intrinsic background has been confirmed by the background measurement with the final prototype.
The Soft X-ray Imager (SXI) is an imaging spectrometer using charge-coupled devices (CCDs) aboard the Hitomi X-ray observatory. The SXI sensor has four CCDs with an imaging area size of $31~{rm mm} times 31~{rm mm}$ arranged in a $2 times 2$ array. C
ombined with the X-ray mirror, the Soft X-ray Telescope, the SXI detects X-rays between $0.4~{rm keV}$ and $12~{rm keV}$ and covers a $38^{prime} times 38^{prime}$ field-of-view. The CCDs are P-channel fully-depleted, back-illumination type with a depletion layer thickness of $200~mu{rm m}$. Low operation temperature down to $-120~^circ{rm C}$ as well as charge injection is employed to reduce the charge transfer inefficiency of the CCDs. The functionality and performance of the SXI are verified in on-ground tests. The energy resolution measured is $161$-$170~{rm eV}$ in full width at half maximum for $5.9~{rm keV}$ X-rays. In the tests, we found that the CTI of some regions are significantly higher. A method is developed to properly treat the position-dependent CTI. Another problem we found is pinholes in the Al coating on the incident surface of the CCDs for optical light blocking. The Al thickness of the contamination blocking filter is increased in order to sufficiently block optical light.
We describe the in-orbit performance of the soft X-ray imaging system consisting of the Soft X-ray Telescope and the Soft X-ray Imager aboard Hitomi. Verification and calibration of imaging and spectroscopic performance are carried out making the bes
t use of the limited data of less than three weeks. Basic performance including a large field of view of 38x38 is verified with the first light image of the Perseus cluster of galaxies. Amongst the small number of observed targets, the on-minus-off pulse image for the out-of-time events of the Crab pulsar enables us to measure a half power diameter of the telescope as about 1.3. The average energy resolution measured with the onboard calibration source events at 5.89 keV is 179 pm 3 eV in full width at half maximum. Light leak and cross talk issues affected the effective exposure time and the effective area, respectively, because all the observations were performed before optimizing an observation schedule and parameters for the dark level calculation. Screening the data affected by these two issues, we measure the background level to be 5.6x10^{-6} counts s^{-1} arcmin^{-2} cm^{-2} in the energy band of 5-12 keV, which is seven times lower than that of the Suzaku XIS-BI.
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