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The Monte Carlo Ferromagnetic Ising model was used to study the electrical properties of manganese oxides due to the charge ordering phase occurring at doping, x = 0.5. The half-doped manganites have an insulator antiferromagnetic ground state. We calculated the internal energy, specific heat, resistivity and the magneto-resistance, MR, with parallel and anti-parallel applied magnetic fields. Our simulation reveals that the resistivity decreases exponentially and the electric current increases with increasing temperature according the free charge increase, to transport from an insulator to conductor phase. The magnetoresistance has negative small values with parallel magnetic field but has positive high values with unti-parallel magnetic field. The obtained semiconductor-metal transition behavior candidates the half-doped manganites to be very good semiconductors diode junctions.
The charge order of CE phase in half-doped manganites is studied, based on an argument that the charge-ordering is caused by the Jahn-Teller distortions of MnO6 octahedra rather than Coulomb repulsion between electrons. The uantitative calculation on
The electronic properties of many transition metal oxide systems require new ideas concerning the behaviour of electrons in solids for their explanation. A recent example, subsequent to that of cuprate superconductors, is of rare earth manganites dop
We systematically study Raman spectroscopy of cleaved Na$_x$CoO$_2$ single crystals with 0.37 $leq$ x $leq$ 0.80. The Raman shift of A$_{1g}$ mode is found to be linearly dependent on Na content, while the Raman shift of E$_{1g}$ mode has an abnormal
The low-temperature Hall resistivity rho_{xy} of La_{2/3}A_{1/3}MnO_3 single crystals (where A stands for Ca, Pb and Ca, or Sr) can be separated into Ordinary and Anomalous contributions, giving rise to Ordinary and Anomalous Hall effects, respective
Structural features of the charge/orbital ordering (CO/OO) in single-layered manganites Pr1-xCa1+xMnO4 have been investigated systematically by transmission electron microscopy. Analyses of electron diffraction patterns as well as dark-field images h