اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدChemical and valence reconstruction at the surface of SmB6 revealed with resonant soft x-ray reflectometry
106
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
Samarium hexaboride (SmB$_6$), a Kondo insulator with mixed valence, has recently attracted much attention as a possible host for correlated topological surface states. Here, we use a combination of x-ray absorption and reflectometry techniques, backed up with a theoretical model for the resonant $M_{4,5}$ absorption edge of Sm and photoemission data, to establish laterally averaged chemical and valence depth profiles at the surface of SmB$_6$. We show that upon cleaving, the highly polar (001) surface of SmB$_6$ undergoes substantial chemical and valence reconstruction, resulting in boron termination and a Sm$^{3+}$ dominated sub-surface region. Whereas at room temperature, the reconstruction occurs on a time scale of less than two hours, it takes about 24 hours below 50 K. The boron termination is eventually established, irrespective of the initial termination. Our findings reconcile earlier depth resolved photoemission and scanning tunneling spectroscopy studies performed at different temperatures and are important for better control of polarity and, as a consequence, surface states in this system.
قيم البحث
اقرأ أيضاً
Samarium hexaboride (SmB6), which lies in the mixed valence regime in the Anderson model, has been predicted to possess topologically protected surface states. The intensive investigations on SmB6 have brought up the long standing questions about the
discrepancy between the surface and bulk electronic properties in rare-earth compounds in general. Here, we investigate and eventually clarify this discrepancy in the particular case of SmB6 by the photoemission core-level spectra. We focus on the change in both Sm and B states depending on time, temperature, probing depth, and surface termination on the cleaved (100) surface. Our spectra show that the unusual time-dependent change in the Sm valence occurs within a period of hours, which is not related to the adsorption of residual gases. Moreover, we observe a reduction of the surface feature in the B and Sm states on the same timescale accompanied by the formation of a subsurface region. Thus, it indicates the relatively slow charge redistribution between the surface and subsurface regions. Our findings demonstrate that the f states is strongly involved in the surface relaxation.
We have investigated the properties of cleaved SmB$_6$ single crystals by x-ray photoelectron spectroscopy. At low temperatures and freshly cleaved samples a surface core level shift is observed which vanishes when the temperature is increased. A Sm
valence between 2.5 - 2.6 is derived from the relative intensities of the Sm$^{2+}$ and Sm$^{3+}$ multiplets. The B/Sm intensity ratio obtained from the core levels is always larger than the stoichiometric value. Possible reasons for this deviation are discussed. The B $1s$ signal shows an unexpected complexity: an anomalous low energy component appears with increasing temperature and is assigned to the formation of a suboxide at the surface. While several interesting intrinsic and extrinsic properties of the SmB$_6$ surface are elucidated in this manuscript no clear indication of a trivial mechanism for the prominent surface conductivity is found.
We investigated the electronic structure of the SrTiO$_3$/LaAlO$_3$ superlattice (SL) by resonant soft x-ray scattering. The (003) peak, which is forbidden for our ideal SL structure, was observed at all photon energies, indicating reconstruction at
the interface. From the peak position analyses taking into account the effects of refraction, we obtained evidence for electronic reconstruction of Ti 3d and O $2p$ states at the interface. From reflectivity analyses, we concluded that the AlO$_2$/LaO/TiO$_2$/SrO and the TiO$_2$/SrO/AlO$_2$/LaO interfaces are quite different, leading to highly asymmetric properties.
Charge transfer in oxide heterostructures can be tuned to promote emergent interfacial states, and accordingly, has been the subject of intense study in recent years. However, accessing the physics at these interfaces, which are often buried deep bel
ow the sample surface, remains difficult. Addressing this challenge requires techniques capable of measuring the local electronic structure with high-resolution depth dependence. Here, we have used linearly-polarized resonant X-ray reflectometry (RXR) as a means to visualize charge transfer in oxide superlattices with atomic layer precision. From our RXR measurements, we extract valence depth profiles of SmTiO$_3$ (SmTO)/SrTiO$_3$ (STO) heterostructures with STO quantum wells varying in thickness from 5 SrO planes down to a single, atomically thin SrO plane. At the polar-nonpolar SmTO/STO interface, an electrostatic discontinuity leads to approximately half an electron per areal unit cell transferred from the interfacial SmO layer into the neighboring STO quantum well. We observe this charge transfer as a suppression of the t$_{2g}$ absorption peaks that minimizes contrast with the neighboring SmTO layers at those energies and leads to a pronounced absence of superlattice peaks in the reflectivity data. Our results demonstrate the sensitivity of RXR to electronic reconstruction at the atomic scale, and establish RXR as a powerful means of characterizing charge transfer at buried oxide interfaces.
We studied the resonant diffraction signal from stepped surfaces of SrTiO3 at the Ti 2p -> 3d (L2,3) resonance in comparison with x-ray absorption (XAS) and specular reflectivity data. The steps on the surface form an artificial superstructure suited
as a model system for resonant soft x-ray diffraction. A small step density on the surface is sufficient to produce a well defined diffraction peak, showing the high sensitivity of the method. At larger incidence angles, the resonant diffraction spectrum from the steps on the surface resembles the spectrum for specular reflectivity. Both deviate from the XAS data in the relative peak intensities and positions of the peak maxima. We determined the optical parameters of the sample across the resonance and found that the differences between the XAS and scattering spectra reflect the different quantities probed in the different signals. When recorded at low incidence or detection angles, XAS and specular reflectivity spectra are distorted by the changes of the angle of total reflection with energy. Also the step peak spectra, though less affected, show an energy shift of the peak maxima in grazing incidence geometry.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
