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We derive entropic uncertainty relations for successive generalized measurements by using general descriptions of quantum measurement within two {distinctive operational} scenarios. In the first scenario, by merging {two successive measurements} into one we consider successive measurement scheme as a method to perform an overall {composite} measurement. In the second scenario, on the other hand, we consider it as a method to measure a pair of jointly measurable observables by marginalizing over the distribution obtained in this scheme. In the course of this work, we identify that limits on ones ability to measure with low uncertainty via this scheme come from intrinsic unsharpness of observables obtained in each scenario. In particular, for the L{u}ders instrument, disturbance caused by the first measurement to the second one gives rise to the unsharpness at least as much as incompatibility of the observables composing successive measurement.
We derive an entropic uncertainty relation for generalized positive-operator-valued measure (POVM) measurements via a direct-sum majorization relation using Schur concavity of entropic quantities in a finite-dimensional Hilbert space. Our approach pr
In the history of quantum mechanics, various types of uncertainty relationships have been introduced to accommodate different operational meanings of Heisenberg uncertainty principle. We derive an optimized entropic uncertainty relation (EUR) that qu
Uncertainty relations are central to quantum physics. While they were originally formulated in terms of variances, they have later been successfully expressed with entropies following the advent of Shannon information theory. Here, we review recent r
How violently do two quantum operators disagree? Different fields of physics feature different measures of incompatibility: (i) In quantum information theory, entropic uncertainty relations constrain measurement outcomes. (ii) In condensed matter and
Under the scenario of generalized measurements, it can be questioned how much of quantum uncertainty can be attributed to measuring device, independent of the uncertainty in the measured system. On the course to answer the question, we suggest a new