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We propose an analytical model for the force-indentation relationship in viscoelastic materials exhibiting a power law relaxation described by an exponent n, where n = 1 represents the standard viscoelastic solid (SLS) model, and n < 1 represents a fractional SLS model. To validate the model, we perform nanoindentation measurements of poylacrylamide gels with atomic force microscopy (AFM) force curves. We found exponents n < 1 that depends on the bysacrylamide concentration. We also demonstrate that the fitting of AFM force curves for varying load speeds can reproduce the dynamic viscoelastic properties of those gels measured with dynamic force modulation methods.
The functional properties of many technological surfaces in biotechnology, electronics, and mechanical engineering depend to a large degree on the individual features of their nanoscale surface texture, which in turn are a function of the surface man
Reliable operation of frequency modulation mode atomic force microscopy (FM-AFM) depends on a clean resonance of an AFM cantilever. It is recognized that the spurious mechanical resonances which originate from various mechanical components in the mic
While offering unprecedented resolution of atomic and electronic structure, Scanning Probe Microscopy techniques have found greater challenges in providing reliable electrostatic characterization at the same scale. In this work, we introduce Electros
Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar aromatic molecule
This paper develops a resolution enhancement method for post-processing the images from Atomic Force Microscopy (AFM). This method is based on deep learning neural networks in the AFM topography measurements. In this study, a very deep convolution ne