اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدA virtual instrument to standardise the calibration of atomic force microscope cantilevers
398
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
Atomic force microscope (AFM) users often calibrate the spring constants of cantilevers using functionality built into individual instruments. This is performed without reference to a global standard, which hinders robust comparison of force measurements reported by different laboratories. In this article, we describe a virtual instrument (an internet-based initiative) whereby users from all laboratories can instantly and quantitatively compare their calibration measurements to those of others - standardising AFM force measurements - and simultaneously enabling non-invasive calibration of AFM cantilevers of any geometry. This global calibration initiative requires no additional instrumentation or data processing on the part of the user. It utilises a single website where users upload currently available data. A proof-of-principle demonstration of this initiative is presented using measured data from five independent laboratories across three countries, which also allows for an assessment of current calibration.
قيم البحث
اقرأ أيضاً
This report describes a cantilever controller for magnetic resonance force microscopy (MRFM) based on a field programmable gate array (FPGA), along with the hardware and software used to integrate the controller into an experiment. The controller is
assembled from a low-cost commercially available software defined radio (SDR) device and libraries of open-source software. The controller includes a digital filter comprising two cascaded second-order sections (biquads), which together can implement transfer functions for optimal cantilever controllers. An appendix in this report shows how to calculate filter coefficients for an optimal controller from measured cantilever characteristics. The controller also includes an input multiplexer and adder used in calibration protocols. Filter coefficients and multiplexer settings can be set and adjusted by control software while an experiment is running. The input is sampled at 64 MHz; the sampling frequency in the filters can be divided down under software control to achieve a good match with filter characterisics. Data reported here were sampled at 500 kHz, chosen for acoustic cantilevers with resonant frequencies near 8 kHz. Inputs are digitized with 12 bits resolution, outputs with 14 bits. The experiment software is organized as a client and server to make it easy to adapt the controller to different experiments. The server encapusulates the details of controller hardware organization, connection technology, filter architecture, and number representation. The same server could be used in any experiment, while a different client encodes the particulars of each experiment.
We constructed a $^3$He magnetic force microscope operating at the base temperature of 300 mK under a vector magnetic field of 2-2-9 T in the $x-y-z$ direction. Fiber optic interferometry as a detection scheme is employed in which two home-built fibe
r walkers are used for the alignment between the cantilever and the optical fiber. The noise level of the laser interferometer is close to its thermodynamic limit. The capabilities of the sub-Kelvin and vector field are demonstrated by imaging the coexistence of magnetism and superconductivity in a ferromagnetic superconductor (ErNi$_2$B$_2$C) at $T$=500 mK and by probing a dipole shape of a single Abrikosov vortex with an in-plane tip magnetization.
Nanometer-scale structures with high aspect ratio such as nanowires and nanotubes combine low mechanical dissipation with high resonance frequencies, making them ideal force transducers and scanning probes in applications requiring the highest sensit
ivity. Such structures promise record force sensitivities combined with ease of use in scanning probe microscopes. A wide variety of possible material compositions and functionalizations is available, allowing for the sensing of various kinds of forces with optimized sensitivity. In addition, nanowires possess quasi-degenerate mechanical mode doublets, which has allowed the demonstration of sensitive vectorial force and mass detection. These developments have driven researchers to use nanowire cantilevers in various force sensing applications, which include imaging of sample surface topography, detection of optomechanical, electrical, and magnetic forces, and magnetic resonance force microscopy. In this review, we discuss the motivation behind using nanowires as force transducers, explain the methods of force sensing with nanowire cantilevers, and give an overview of the experimental progress and future prospects of the field.
Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for statistically significant sample sizes means that data collection can be a
n extremely lengthy process in AFM. The use of a single AFM instrument is known for its very low speed and not being suitable for scanning large areas, resulting in very-low-throughput measurement. We address this challenge by parallelizing AFM instruments. The parallelization is achieved by miniaturizing the AFM instrument and operating many of them simultaneously. This nanoinstrument has the advantages that each miniaturized AFM can be operated independently and that the advances in the field of AFM, both in terms of speed and imaging modalities, can be implemented more easily. Moreover, a parallel AFM instrument also allows one to measure several physical parameters simultaneously; while one instrument measures nano-scale topography, another instrument can measure mechanical, electrical or thermal properties, making it a Lab-on-an-Instrument. In this paper, a proof of principle (PoP) of such a parallel AFM instrument has been demonstrated by analyzing the topography of large samples such as semiconductor wafers. This nanoinstrument provides new research opportunities in the nanometrology of wafers and nanolithography masks by enabling real die-to-die and wafer-level measurements and in cell biology by measuring the nano-scale properties of a large number of cells.
Dedicated accelerometers have been developed for the MICROSCOPE mission taking into account the specific range of acceleration to be measured on board the satellite. Considering one micro-g and even less as the full range of the instrument, leads to
a customized concept and a high performance electronics for the sensing and servo-actuations of the accelerometer test-masses. In addition to a very accurate geometrical sensor core, a high performance electronics architecture provides the measurement of the weak electrostatic forces and torques applied to the test-masses. A set of capacitive sensors delivers the position and the attitude of the test-mass with respect to a very steady gold coated cage made in silica. The voltages applied on the electrodes surrounding each test-mass are finely controlled to generate the adequate electrical field and so the electrostatic pressures on the test-mass. This field maintains the test-mass motionless with respect to the instrument structure. Digital control laws are implemented in order to enable instrument operation flexibility and a weak position sensor noise. These electronics provide both the scientific data for MICROSCOPEs test of General Relativity and the data for the satellite drag-free and attitude control system (DFACS).
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
