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We exploit the near field enhancement of nano-antennas to investigate the Raman spectra of otherwise not optically detectable carbon nanotubes (CNTs). We demonstrate that a top-down fabrication approach is particularly promising when applied to CNTs, owing to the sharp dependence of the scattered intensity on the angle between incident light polarization and CNT axis. In contrast to tip enhancement techniques, our method enables us to control the light polarization in the sample plane, locally amplifying and rotating the incident field and hence optimizing the Raman signal. Such promising features are confirmed by numerical simulations presented here. The relative ease of fabrication and alignment makes this technique suitable for the realization of integrated devices that combine scanning probe, optical, and transport characterization.
We report experimental measurements of electronic Raman scattering under resonant conditions by electrons in individual single-walled carbon nanotubes (SWNTs). The inelastic Raman scattering at low frequency range reveals a single particle excitation
In this paper, we investigate the low frequency Raman spectra of multi-wall carbon nanotubes (MWNT) prepared by the electric arc method. Low frequency Raman modes are unambiguously identified on purified samples thanks to the small internal diameter
We report a measurement on quantum capacitance of individual semiconducting and small band gap SWNTs. The observed quantum capacitance is remarkably smaller than that originating from density of states and it implies a strong electron correlation in SWNTs.
With the empirical bond polarizability model, the nonresonant Raman spectra of the chiral and achiral single-wall carbon nanotubes (SWCNTs) under uniaxial and torsional strains have been systematically studied by textit{ab initio} method. It is found
The electronic Raman scattering (ERS) features of single-walled carbon nanotubes (SWNTs) can reveal a wealth of information about their electronic structures, but have previously been thought to appear exclusively in metallic (M-) but not in semicond