اشترك بالحزمة الذهبية واحصل على وصول غير محدود شمرا أكاديميا
تسجيل مستخدم جديدEvidence for In-Plane Tetragonal c-axis in Mn$_x$Ga$_{1-x}$ Thin Films using Transmission Electron Microscopy
121
0
0.0
(
0
)
اسأل ChatGPT حول البحث
ﻻ يوجد ملخص باللغة العربية
Tetragonal Mn$_x$Ga$_{1-x}$ (x=0.70, 0.75) thin films grown on SrTiO$_3$ substrates at different temperatures and thicknesses exhibit perpendicular magnetic anisotropy with coercive fields between 1-2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40nm samples grown at 300-350$^{o}$C lead to polycrystalline films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in a secondary magnetic component in the out of plane magnetization. Growth at 300$^{o}$C with a reduced thickness or Mn concentration significantly decreases the presence of the tetragonal c-axis in the film plane, thus improving the magnetic properties. TEM is of critical importance in characterizing these materials, since conventional XRD cannot always identify the presence of additional crystallographic orientations although they can still affect the magnetic properties. Our study points to ways that the microstructure of these thin films can be controlled, which is critical for utilization of this material in spintronic devices.
قيم البحث
اقرأ أيضاً
We show, by SQUID magnetometry, that in (Ga,Mn)As films the in-plane uniaxial magnetic easy axis is consistently associated with particular crystallographic directions and that it can be rotated from the [-110] direction to the [110] direction by low
temperature annealing. We show that this behavior is hole-density-dependent and does not originate from surface anisotropy. The presence of uniaxial anisotropy as well its dependence on the hole-concentration and temperature can be explained in terms of the p-d Zener model of the ferromagnetism assuming a small trigonal distortion.
We have measured the magnetoresistance in a series of Ga$_{1-x}$Mn$_x$As samples with 0.033$le x le$ 0.053 for three mutually orthogonal orientations of the applied magnetic field. The spontaneous resistivity anisotropy (SRA) in these materials is ne
gative (i.e. the sample resistance is higher when its magnetization is perpendicular to the measuring current than when the two are parallel) and has a magnitude on the order of 5% at temperatures near 10K and below. This stands in contrast to the results for most conventional magnetic materials where the SRA is considerably smaller in magnitude for those few cases in which a negative sign is observed. The magnitude of the SRA drops from its maximum at low temperatures to zero at T$_C$ in a manner that is consistent with mean field theory. These results should provide a significant test for emerging theories of transport in this new class of materials.
In this work we report the appearence of a large perpendicular magnetic anisotropy (PMA) in Fe$_{1-x}$Ga$_x$ thin films grown onto ZnSe/GaAs(100). This arising anisotropy is related to the tetragonal metastable phase in as-grown samples recently repo
rted [M. Eddrief {it et al.}, Phys. Rev. B {bf 84}, 161410 (2011)]. By means of ferromagnetic resonance studies we measured PMA values up to $sim$ 5$times$10$^5$ J/m$^3$. PMA vanishes when the cubic structure is recovered upon annealing at 300$^{circ}$C. Despite the important values of the magnetoelastic constants measured via the cantilever method, the consequent magnetoelastic contribution to PMA is not enough to explain the observed anisotropy values in the distorted state. {it Ab initio} calculations show that the chemical ordering plays a crucial role in the appearance of PMA. Through a phenomenological model we are able to explain that an excess of next nearest neighbour Ga pairs (B$_2$-like ordering) along the perpendicular direction arises as the source of PMA in Fe$_{1-x}$Ga$_x$ thin films.
Nanometric inclusions filled with nitrogen, located adjacent to FenN (n = 3 or 4) nanocrystals within (Ga,Fe)N layers, are identified and characterized using scanning transmission electron microscopy (STEM) and electron energy-loss spectroscopy (EELS
). High-resolution STEM images reveal a truncation of the Fe-N nanocrystals at their boundaries with the nitrogen-containing inclusion. A controlled electron beam hole drilling experiment is used to release nitrogen gas from an inclusion in situ in the electron microscope. The density of nitrogen in an individual inclusion is measured to be 1.4 +- 0.3 g/cm3. These observations provide an explanation for the location of surplus nitrogen in the (Ga,Fe)N layers, which is liberated by the nucleation of FenN (n> 1) nanocrystals during growth.
We have investigated the electronic structure of the $p$-type diluted magnetic semiconductor In$_{1-x}$Mn$_x$As by photoemission spectroscopy. The Mn 3$d$ partial density of states is found to be basically similar to that of Ga$_{1-x}$Mn$_x$As. How
ever, the impurity-band like states near the top of the valence band have not been observed by angle-resolved photoemission spectroscopy unlike Ga$_{1-x}$Mn$_x$As. This difference would explain the difference in transport, magnetic and optical properties of In$_{1-x}$Mn$_x$As and Ga$_{1-x}$Mn$_x$As. The different electronic structures are attributed to the weaker Mn 3$d$ - As 4$p$ hybridization in In$_{1-x}$Mn$_x$As than in Ga$_{1-x}$Mn$_x$As.
سجل دخول لتتمكن من نشر تعليقات
التعليقات
جاري جلب التعليقات
سجل دخول لتتمكن من متابعة معايير البحث التي قمت باختيارها
