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تسجيل مستخدم جديدPhotodegradation Mechanisms of Tetraphenyl Butadiene Coatings for Liquid Argon Detectors
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We report on studies of degradation mechanisms of tetraphenyl butadiene (TPB) coatings of the type used in neutrino and dark matter liquid argon experiments. Using gas chromatography coupled to mass spectrometry we have detected the ultraviolet-blocking impurity benzophenone (BP). We monitored the drop in performance and increase of benzophenone concentration in TPB plates with exposure to ultraviolet (UV) light, and demonstrate the correlation between these two variables. Based on the presence and initially exponential increase in the concentration of benzophenone observed, we propose that TPB degradation is a free radical-mediated photooxidation reaction, which is subsequently confirmed by displaying delayed degradation using a free radical inhibitor. Finally we show that the performance of wavelength-shifting coatings of the type envisioned for the LBNE experiment can be improved by 10-20%, with significantly delayed UV degradation, by using a 20% admixture of 4-tert-Butylcatechol.
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We study the stability of three types of popularly employed TPB coatings under immersion in liquid argon. TPB emanation from each coating is quantified by fluorescence assay of molecular sieve filter material after a prolonged soak time. Two of the c
oatings are shown to emanate a detectable concentration of TPB into argon over a 24 hour period, which corresponds to tens of parts per billion in argon by mass. In an independent setup, the dissolved or suspended TPB is shown to produce a wavelength shifting effect in the argon bulk. Interpretations of these results and implications for present and future liquid argon time projection chamber experiments are discussed.
TetraPhenyl Butadiene is the wavelength shifter most widely used in combination with liquid Argon. The latter emits scintillation photons with a wavelength of 127 nm that need to be downshifted to be detected by photomultipliers with glass or quartz
windows. TetraPhenyl Butadiene has been demonstrated to have an extremely high conversion efficiency, possibly higher than 100 % for 127 nm photons, while there is no precise information about the time dependence of its emission. It is usually assumed to be exponentially decaying with a characteristic time of the order of one ns, as an extrapolation from measurements with exciting radiation in the near UV. This work shows that TetraPhenyl Butadiene, when excited by 127 nm photons, reemits photons not only with a very short decay time, but also with slower ones due to triplet states de-excitations. This fact can strongly contribute to clarify the anomalies in liquid Argon scintillation light reported in literature since seventies, namely the inconsistency in the measured values of the long decay time constant and the appearance of an intermediate component. Similar effects should be also expected when the TPB is used in combination with Helium and Neon, that emit scintillation photons with wavelengths shorter than 127 nm.
To increase the light yield of a liquid Ar (LAr) detector, we optimized the evaporation technique of tetraphenyl butadiene (TPB) on the detector surface and tested the operability of a silicon photomultiplier (SiPM), namely, the multi-pixel photon co
unter with through-silicon-via (TSV-MPPC, Hamamatsu Photonics K.K.) at LAr temperature. TPB converts the LAr scintillations (vacuum ultraviolet light) to visible light, which can be detected by high-sensitivity photosensors. Because the light yield depends on the deposition mass of TPB on the inner surface of the detector, we constructed a well-controlled TPB evaporator to ensure reproducibility and measured the TPB deposition mass using a quartz crystal microbalance sensor. After optimizing the deposition mass of TPB (30 $mu g/cm^2$ on the photosensor window and 40 $mu g/cm^2$ on the detector wall), the light yield was 12.8 $pm$ 0.3 p.e./keVee using PMTs with a quantum efficiency of approximately 30% for TPB-converted light. We also tested the low-temperature tolerance of TSV-MPPC, which has a high photon-detection efficiency, in the LAr environment. The TSV-MPPC detected the LAr scintillations converted by TPB with a photon-detection efficiency exceeding 50%.
Impurities in noble liquid detectors used for neutrino and dark matter experiments can significantly impact the quality of data. We present an experimentally verified model for describing the dynamics of impurity distributions in liquid argon (LAr) d
etectors. The model considers sources, sinks, and transport of impurities within and between the gas and liquid argon phases. Measurements of oxygen concentrations in a 20-L LAr multi-purpose test stand are compared to calculations made with this model to show that an accurate description of the concentrations under various operational conditions can be obtained. A result of this analysis is a determination of Henrys coefficient for oxygen in LAr. These calculations also show that some processes have small effects on the impurity dynamics and excluding them yields a solution as a sum of two exponential terms. This solution provides a simple way to extract Henrys coefficient with negligible approximation error. It is applied to the data and the Henrys coefficient for oxygen in LAr is obtained as 0.84$^{+0.09}_{-0.05}$, consistent with literature results. Based on the analysis of the data with the model, we further suggest that, for a large liquid argon detector, barriers to flow (baffles) installed in the gas phase to restrict flow can help reduce the ultimate impurity concentration in the LAr.
The use of efficient wavelength-shifters from the vacuum-ultraviolet to the photosensors range of sensitivity is a key feature in detectors for Dark Matter search and neutrino physics based on liquid argon scintillation detection. Thin film of Tetrap
henyl-butadiene (TPB) deposited onto the surface delimiting the active volume of the detector and/or onto the photosensor optical window is the most common solution in current and planned experiments. Detector design and response can be evaluated and correctly simulated only when the properties of the optical system in use (TPB film + substrate) are fully understood. Characterization of the optical system requires specific, sometimes sophisticated optical methodologies. In this paper the main features of TPB coatings on different, commonly used substrates is reported, as a result of two independent campaigns of measurements at the specialized optical metrology labs of ENEA and University of Tor Vergata. Measured features include TPB emission spectra with lineshape and relative intensity variation recorded as a function of the film thickness and for the first time down to LAr temperature, as well as optical reflectance and transmittance spectra of the TPB coated substrates in the wavelength range of the TPB emission.
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