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Reversible circuits find applications in many areas of Computer Science including Quantum Computation. This paper examines the testability of an important subclass of reversible logic circuits that are composed of k-wire controlled NOT (k-CNOT with k >/- 1) gates. A reversible k-CNOT gate can be implemented using an irreversible k-input AND gate and an EXOR gate. A reversible k-CNOT circuit where each k-CNOT gate is realized using irreversible k-input AND and EXOR gate, has been considered. One of the most commonly used Single Bridging Fault model (both wired-AND and wired-OR) has been assumed to be type of fault for such circuits. It has been shown that an (n+p)-input AND-EXOR based reversible logic circuit with p observable outputs, can be tested for single bridging faults (SBF) using (3n + lefthalfcap log2p righthalfcap + 2) tests.
In recent years reversible logic has been considered as an important issue for designing low power digital circuits. It has voluminous applications in the present rising nanotechnology such as DNA computing, Quantum Computing, low power VLSI and quan
Iterative Logic Arrays (ILAs) are ideal as VLSI sub-systems because of their regular structure and its close resemblance with FPGAs (Field Programmable Gate Arrays). Reversible circuits are of interest in the design of very low power circuits where e
It is now widely accepted that the CMOS technology implementing irreversible logic will hit a scaling limit beyond 2016, and that the increased power dissipation is a major limiting factor. Reversible computing can potentially require arbitrarily sma
The paper studies the main aspects of the realization of 2 x 2 ternary reversible circuits based on cycles, considering the results of the realization of all 362,880 2 x 2 ternary reversible functions. It has been shown that in most cases, realizatio
Reversible logic is experience renewed interest as we are approach the limits of CMOS technologies. While physical implementations of reversible gates have yet to materialize, it is safe to assume that they will rely on faulty individual components.