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تسجيل مستخدم جديدDevelopment of Tracking Detectors with industrially produced GEM Foils
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The planned tracking upgrade of the STAR experiment at RHIC includes a large-area GEM tracker used to determine the charge sign of electrons and positrons produced from W+(-) decays. For such a large-scale project commercial availability of GEM foils is necessary. We report first results obtained with a triple GEM detector using GEM foils produced by Tech-Etch Inc. of Plymouth, MA, USA. Measurements of gain uniformity, long-term stability as well as measurements of the energy resolution for X-Rays are compared to results obtained with an identical detector using GEM foils produced at CERN. A quality assurance procedure based on optical tests using an automated high-resolution scanner has been established, allowing a study of the correlation of the observed behavior of the detector and the geometrical properties of the GEM foils. Detectors based on Tech-Etch and CERN produced foils both show good uniformity of the gain over the active area and stable gain after an initial charge-up period, making them well suited for precision tracking applications.
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Three Gas-Electron-Multiplier tracking detectors with an active area of 10 cm x 10 cm and a two-dimensional, laser-etched orthogonal strip readout have been tested extensively in particle beams at the Meson Test Beam Facility at Fermilab. These detec
tors used GEM foils produced by Tech-Etch, Inc. They showed an efficiency in excess of 95% and spatial resolution better than 70 um. The influence of the angle of incidence of particles on efficiency and spatial resolution was studied in detail.
Many experiments are currently using or proposing to use large area GEM foils in their detectors, which is creating a need for commercially available GEM foils. Currently CERN is the only main distributor of large GEM foils, however with the growing
interest in GEM technology keeping up with the increasing demand for GEMs will be difficult. Thus the commercialization of GEMs up to 50 $times$ 50 cm$^2$ has been established by Tech-Etch Inc. of Plymouth, MA, USA using the single-mask technique. The electrical performance and optical quality of the single-mask GEM foils have been found to be on par with those produced by CERN. The next critical step towards validating the Tech-Etch single-mask GEM foils is to test their performance under physics conditions. These measurements will allow us to quantify and compare the gain and efficiency of the detector to other triple-GEM detectors. This will be done by constructing several single-mask triple-GEM detectors, using foils manufactured by Tech-Etch, which follow the design used by the STAR Forward GEM Tracker (FGT). These detectors will investigate ways in which to further decrease the material budget and increase the efficiency of the detector by incorporating perforated Kapton spacer rings rather than G10 spacing grids to reduce the dead area of the detector. The materials and tooling needed to assemble the triple-GEM detectors have been acquired. The GEM foils have been electrically tested, and a handful have been optically scanned. We found these results to be consistent with GEM foils produced by CERN. With the success of these initial tests, construction of the triple-GEM detectors is now under way.
With future experiments proposing detectors that utilize very large-area GEM foils, there is a need for commercially available GEM foils. Double-mask etching techniques pose a clear limitation in the maximum size of GEM foils. In contrast, single-mas
k techniques developed at CERN would allow one to overcome those limitations. However with interest in GEM foils increasing and CERN being the only main distributor, keeping up with the demand for GEM foils will be difficult. Thus the commercialization of GEMs has been established by Tech-Etch of Plymouth, MA, USA using single-mask techniques. We report on the electrical and geometrical properties, along with the inner and outer hole diameter size uniformity of 10 $times$ 10 cm$^2$ and 40$times$40 cm$^2$ GEM foils. The Tech-Etch foils were found to have excellent electrical properties. The measured mean optical properties were found to reflect the desired parameters and are consistent with those measured in double-mask GEM foils, and show good hole diameter uniformity over the active area. These foils are well suited for future applications in nuclear and particle physics where tracking devices are needed.
The recently completed Forward GEM Tracker (FGT) of the STAR experiment at RHIC took advantage of commercially produced GEM foils based on double-mask chemical etching techniques. With future experiments proposing detectors that utilize very large-ar
ea GEM foils, there is a need for commercially available GEM foils. Double-mask etching techniques pose a clear limitation in the maximum size. In contrast, single-mask techniques developed at CERN would allow one to overcome those limitations. We report on results obtained using 10 $times$ 10 cm$^2$ and 40$times$40 cm$^2$ GEM foils produced by Tech-Etch Inc. of Plymouth, MA, USA using single-mask techniques and thus the beginning for large GEM foil production on a commercial basis. A quality assurance procedure has been established through electrical and optical analyses via leakage current measurements and an automated high-resolution CCD scanner. The Tech-Etch foils show excellent electrical properties with leakage currents typically measured below 1 nA. The geometrical properties of the Tech-Etch single-mask foils were found to be consistent with one another, and were in line with geometrical specifications from previously measured double-mask foils. The single-mask foils displayed good inner and outer hole diameter uniformities over the entire active area.
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