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Magnetic spiral structures can exhibit ferroelectric moments as recently demonstrated in various multiferroic materials. In such cases the helicity of the magnetic spiral is directly correlated with the direction of the ferroelectric moment and measurement of the helicity of magnetic structures is of current interest. Soft x-ray resonant diffraction is particularly advantageous because it combines element selectivity with a large magnetic cross-section. We calculate the polarization dependence of the resonant magnetic x-ray cross-section (electric dipole transition) for the basal plane magnetic spiral in hexaferrite Ba0.8Sr1.2Zn2Fe12O22 and deduce its domain population using circular polarized incident radiation. We demonstrate there is a direct correlation between the diffracted radiation and the helicity of the magnetic spiral.
Resonant angle scanned x-ray photoelectron diffraction (RXPD) allows the determination of the atomic and magnetic structure of surfaces and interfaces. For the case of magnetized nickel the resonant L2 excitation with circularly polarized light yield
The frustrated magnet has been regarded as a system that could be a promising host material for the quantum spin liquid (QSL). However, it is difficult to determine the spin configuration and the corresponding mechanism in this system, because of its
Chiral properties of the two phases - collinear motif (below Morin transition temperature, TM=250 K) and canted motif (above TM) - of magnetically ordered hematite ({alpha}-Fe2O3) have been identified in single crystal resonant x-ray Bragg diffractio
Resonant magnetic x-ray diffraction experiments were carried out on the stacked triangular lattice antiferromagnet GdPd2Al3. The experiments revealed an expected initial collinear c-axis order at TN1 followed by an additional in-plane order at TN2, w
Field-dependent magnetic structure of a layered Dirac material EuMnBi$_2$ was investigated in detail by the single crystal neutron diffraction and the resonant x-ray magnetic diffraction techniques. On the basis of the reflection conditions in the an