Ferromagnetic/metallic manganese perovskites, such as La2/3Sr1/3MnO3 (LSMO)are promising materials for the design and implementation of novel spintronic devices working at room temperature. However, their implementation in practical applications has
been severely hampered due to the breakdown of their magnetotransport properties at temperatures well below their magnetic transition temperature. This breakdown has been usually associated to surface and interface related problems but its physical origin has not been clearly established yet. In this work we investigate the interface between La2/3Sr1/3MnO3 (LSMO) thin films and different capping layers by means of x-ray linear dichroism and transport measurements. Our data reveal that, irrespective to the capping material, LSMO/capping layer bilayers exhibit an antiferromegnetic/insulating phase at the interface, likely to originate from a preferential occupancy of Mn 3d 3z2-r2 eg orbitals. This phase, which extends ca. 2 unit cells, is also observed in an uncapped LSMO reference sample thus, pointing to an intrinsic interfacial phase separation phenomenon, likely to be promoted by the structural disruption and symmetry breaking at the LSMO free surface/interface. These experimental observations strongly suggest that the structural disruption at the LSMO interfaces play a major role on the observed depressed magnetotransport properties in manganite-based magnetic tunneling junctions and it is at the origin of the so-called dead layer.
A Mn valence instability on La2/3Ca1/3MnO3 thin films, grown on LaAlO3 (001)substrates is observed by x-ray absorption spectroscopy at the Mn L-edge and O K-edge. As-grown samples, in situ annealed at 800 C in oxygen, exhibit a Curie temperature well
below that of the bulk material. Upon air exposure a reduction of the saturation magnetization, MS, of the films is detected. Simultaneously a Mn2+ spectral signature develops, in addition to the expected Mn3+ and Mn4+ contributions, which increases with time. The similarity of the spectral results obtained by total electron yield and fluorescence yield spectroscopy indicates that the location of the Mn valence anomalies is not confined to a narrow surface region of the film, but can extend throughout the whole thickness of the sample. High temperature annealing at 1000 C in air, immediately after growth, improves the magnetic and transport properties of such films towards the bulk values and the Mn2+ signature in the spectra does not appear. The Mn valence is then stable even to prolonged air exposure. We propose a mechanism for the Mn2+ ions formation and discuss the importance of these observations with respect to previous findings and production of thin films devices.
Surface magnetic properties of perovskite manganites have been a recurrent topic during last years since they play a major role in the implementation of magnetoelectronic devices. Magneto-optical techniques, such as X-ray magnetic circular dichroism,
turn out to be a very efficient tool to study surface magnetism due to their sensitivity to magnetic and chemical variations across the sample depth. Nevertheless, the application of the sum rules for the determination of the spin magnetic moment might lead to uncertainties as large as 40% in case of Mn ions. To overcome this problem we present an alternative approach consisting of using X-ray magnetic circular dichroism in reflection geometry. Fit of the data by using a computer code based in a 4X4 matrix formalism leads to realistic results. In particular, we show that surface and interface roughness are of major relevance for a proper description of the experimental data and a correct interpretation of the results. By using such an approach we demonstrate the presence of a narrow surface region with strongly depressed magnetic properties in La2/3Ca1/3MnO3 thin films.
