The Hot Slumping Technology is under development by several research groups in the world for the realization of grazing-incidence segmented mirrors for X-ray astronomy, based on thin glass plates shaped over a mould at temperatures above the transfor
mation point. The performed thermal cycle and related operations might have effects on the strength characteristics of the glass, with consequences on the structural design of the elemental optical modules and consecutively on the entire X-ray optic for large astronomical missions like IXO and ATHENA. The mechanical strength of glass plates after they underwent the slumping process was tested through destructive double-ring tests in the context of a study performed by the Astronomical Observatory of Brera with the collaboration of Stazione Sperimentale del Vetro and BCV Progetti. The entire study has been realized on more than 200 D263 Schott borosilicate glass specimens of dimension 100 mm x 100 mm and thickness 0.4 mm, either flat or bent at a Radius of Curvature of 1000 mm through the particular pressure assisted hot slumping process developed by INAF-OAB. The collected experimental data have been compared to non-linear FEM analyses and treated with Weibull statistic to assess the current IXO glass X-ray telescope design, in terms of survival probability, when subject to static and acoustic loads characteristic of the launch phase. The paper describes the activities performed and presents the obtained results.
The Joint European X-ray Telescope (JET-X) was the core instrument of the Russian Spectrum-X-gamma space observatory. It consisted of two identical soft X-ray (0.3 - 10 keV) telescopes with focusing optical modules having a measured angular resolutio
n of nearly 15 arcsec. Soon after the payload completion, the mission was cancelled and the two optical flight modules (FM) were brought to the Brera Astronomical Observatory where they had been manufactured. After 16 years of storage, we have utilized the JET-X FM2 to test at the PANTER X-ray facility a prototype of a novel X-ray polarimetric telescope, using a Gas Pixel Detector (GPD) with polarimetric capabilities in the focal plane of the FM2. The GPD was developed by a collaboration between INFN-Pisa and INAF-IAPS. In the first phase of the test campaign, we have re-tested the FM2 at PANTER to have an up-to-date characterization in terms of angular resolution and effective area, while in the second part of the test the GPD has been placed in the focal plane of the FM2. In this paper we report the results of the tests of the sole FM2, using an unpolarized X-ray source, comparing the results with the calibration done in 1996.
To enhance the reflectivity of X-ray mirrors beyond the critical angle, multilayer coatings are required. Interface imperfections in the multilayer growth process are known to cause non-specular scattering and degrade the mirror optical performance;
therefore, it is important to predict the amount of X-ray scattering from the rough topography of the outer surface of the coating, which can be directly measured, e.g., with an Atomic Force Microscope (AFM). This kind of characterization, combined with X-ray reflectivity measurements to assess the deep multilayer stack structure, can be used to model the layer roughening during the growth process via a well-known roughness evolution model. In this work, X-ray scattering measurements are performed and compared with simulations obtained from the modeled interfacial Power Spectral Densities (PSDs) and the modeled Crossed Spectral Densities for all the couples of interfaces. We already used this approach in a previous work for periodic multilayers; we now show how this method can be extended to graded multilayers. The upgraded code is validated for both periodic and graded multilayers, with a good accord between experimental data and model findings. Doing this, different kind of defects observed in AFM scans are included in the PSD analysis. The subsequent data-model comparison enables us to recognize them as surface contamination or interfacial defects that contribute to the X-ray scattering of the multilayer.
X-ray mirrors with high focusing performances are in use in both mirror modules for X-ray telescopes and in synchrotron and FEL (Free Electron Laser) beamlines. A degradation of the focus sharpness arises in general from geometrical deformations and
surface roughness, the former usually described by geometrical optics and the latter by physical optics. In general, technological developments are aimed at a very tight focusing, which requires the mirror profile to comply with the nominal shape as much as possible and to keep the roughness at a negligible level. However, a deliberate deformation of the mirror can be made to endow the focus with a desired size and distribution, via piezo actuators as done at the EIS-TIMEX beamline of FERMI@Elettra. The resulting profile can be characterized with a Long Trace Profilometer and correlated with the expected optical quality via a wavefront propagation code. However, if the roughness contribution can be neglected, the computation can be performed via a ray-tracing routine, and, under opportune assumptions, the focal spot profile (the Point Spread Function, PSF) can even be predicted analytically. The advantage of this approach is that the analytical relation can be reversed; i.e, from the desired PSF the required mirror profile can be computed easily, thereby avoiding the use of complex and time-consuming numerical codes. The method can also be suited in the case of spatially inhomogeneous beam intensities, as commonly experienced at Synchrotrons and FELs. In this work we expose the analytical method and the application to the beam shaping problem.
