Stimulated surface- and edge-emission were investigated for ZnO thin films grown epitaxially by pulsed laser deposition. The lasing threshold was 0.32 MW/cm2 for surface pumping and 0.5 MW/cm2 for edge pumping, which is significantly lower than thres
holds observed previously. A modified variable stripe length method was used to measure the gain, which was 1369 cm-1 for N-band emission. Losses were measured using the shifting excitation spot method and values of 6.2 cm-1 and 6.3 cm-1 were found for the N-band and P-band, respectively. The measured gain and loss were the highest and lowest (respectively) ever reported for ZnO films.
Zinc oxide (ZnO) epitaxial thin films grown on c-sapphire substrates by pulsed laser deposition were investigated using angle and polarization-resolved photoluminescence spectroscopy. Side-emission spectra differed significantly from surface-emission
spectra in exhibiting dominant, narrow, polarization-resolved peaks. These spectral features were attributed to leaky substrate modes in the layers. Observations were first verified using transmission calculations with non-adjustable parameters, which took into account the dispersion, the anisotropy of the ZnO refractive index and the dependence on film thickness. Results were consistent with Fabry-Perot-like interference being the origin of the distinctive ZnO luminescence observed at grazing incidence angles. A second analysis, based on the source terms method, was used in order to retrieve the bulk emission properties, including the wavelength-dependent quantum yield and the emission anisotropy. While ZnO thin films were considered here, this analysis method can be extended to any luminescent thin film of similar geometry, demonstrating the potential of leaky mode analysis for probing passive and active material properties.
We present a theoretical study on the impact of an active optical layer on the emission properties of an ultrathin luminescent film. While the study can be generalized to any material, we focus here on a simple layered medium composed of a conjugated
polymers (CPs) thin film, a zinc oxide layer (ZnO) and a sapphire substrate. The study spreads throughout variable aspects including the effect of the structure parameters on the CP luminescence and radiation pattern and more specifically the influence of the absorption and emission properties of the active layer. Comparing between the passive and active layer cases, the obtained results show that an enhancement of the CP luminescence of more than 20 times can be obtained by using an optically active underlying layer. The results can be explained in terms of photon recycling where the optically active layer acts as a photon reservoir and a secondary light source for the ultra thin film. This general concept is of a special interest for ultra-trace chemosensor.
Zinc Oxide thin films were grown on c-sapphire substrates using pulsed laser deposition. Pump power dependence of surface emission spectra, acquired using a quadrupled 266 nm laser, revealed room temperature stimulated emission (threshold of 900 kW/c
m2). Time dependent spectral analysis plus gain measurements of single-shot, side-emission, spectra pumped with a nitrogen laser revealed random lasing indicative of the presence of self-forming laser cavities. It is suggested that random lasing in an epitaxial system rather than a 3-dimensional configuration of disordered scattering elements, was due to waveguiding in the film. Waveguiding causes light to be amplified within randomly-formed closed-loops acting as lasing cavities.
