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Functional composite thin films have a wide variety of applications in flexible and/or electronic devices, telecommunications and multifunctional emerging coatings. Rapid screening of their properties is a challenging task, especially with multiple c omponents defining the targeted properties. In this work we present a manifold for accelerated automated screening of viscous graphene suspensions for optimal electrical conductivity. Using Opentrons OT2 robotic auto-pipettor, we tested 3 most industrially significant surfactants - PVP, SDS and T80 - by fabricating 288 samples of graphene suspensions in aqueous hydroxypropylmethylcellulose. Enabled by our custom motorized 4-point probe measurement setup and computer vision algorithms, we then measured electrical conductivity of every sample using custom and identified that the highest performance is achieved for PVP-based samples, peaking at 10.4 mS/cm. The automation of the experimental procedure allowed us to perform majority of the experiments using robots, while involvement of human researcher was kept to minimum. Overall the experiment was completed in less than 18 hours, only 3 of which involved humans.
In the field of machine learning (ML) for materials optimization, active learning algorithms, such as Bayesian Optimization (BO), have been leveraged for guiding autonomous and high-throughput experimentation systems. However, very few studies have e valuated the efficiency of BO as a general optimization algorithm across a broad range of experimental materials science domains. In this work, we evaluate the performance of BO algorithms with a collection of surrogate model and acquisition function pairs across five diverse experimental materials systems, namely carbon nanotube polymer blends, silver nanoparticles, lead-halide perovskites, as well as additively manufactured polymer structures and shapes. By defining acceleration and enhancement metrics for general materials optimization objectives, we find that for surrogate model selection, Gaussian Process (GP) with anisotropic kernels (automatic relevance detection, ARD) and Random Forests (RF) have comparable performance and both outperform the commonly used GP without ARD. We discuss the implicit distributional assumptions of RF and GP, and the benefits of using GP with anisotropic kernels in detail. We provide practical insights for experimentalists on surrogate model selection of BO during materials optimization campaigns.
101 - Zekun Ren , Juhwan Noh , Siyu Tian 2020
Deep learning has fostered many novel applications in materials informatics. However, the inverse design of inorganic crystals, $textit{i.e.}$ generating new crystal structure with targeted properties, remains a grand challenge. An important ingredie nt for such generative models is an invertible representation that accesses the full periodic table. This is challenging due to limited data availability and the complexity of 3D periodic crystal structures. In this paper, we present a generalized invertible representation that encodes the crystallographic information into the descriptors in both real space and reciprocal space. Combining with a generative variational autoencoder (VAE), a wide range of crystallographic structures and chemistries with desired properties can be inverse-designed. We show that our VAE model predicts novel crystal structures that do not exist in the training and test database (Materials Project) with targeted formation energies and band gaps. We validate those predicted crystals by first-principles calculations. Finally, to design solids with practical applications, we address the sparse label problem by building a semi-supervised VAE and demonstrate its successful prediction of unique thermoelectric materials
Process optimization of photovoltaic devices is a time-intensive, trial and error endeavor, without full transparency of the underlying physics, and with user-imposed constraints that may or may not lead to a global optimum. Herein, we demonstrate th at embedding physics domain knowledge into a Bayesian network enables an optimization approach that identifies the root cause(s) of underperformance with layer by-layer resolution and reveals alternative optimal process windows beyond global black-box optimization. Our Bayesian-network approach links process conditions to materials descriptors (bulk and interface properties, e.g., bulk lifetime, doping, and surface recombination) and device performance parameters (e.g., cell efficiency), using a Bayesian inference framework with an autoencoder-based surrogate device-physics model that is 100x faster than numerical solvers. With the trained surrogate model, our approach is robust and reduces significantly the time consuming experimentalist intervention, even with small numbers of fabricated samples. To demonstrate our method, we perform layer-by-layer optimization of GaAs solar cells. In a single cycle of learning, we find an improved growth temperature for the GaAs solar cells without any secondary measurements, and demonstrate a 6.5% relative AM1.5G efficiency improvement above baseline and traditional black-box optimization methods.
X-ray diffraction (XRD) data acquisition and analysis is among the most time-consuming steps in the development cycle of novel thin-film materials. We propose a machine-learning-enabled approach to predict crystallographic dimensionality and space gr oup from a limited number of thin-film XRD patterns. We overcome the scarce-data problem intrinsic to novel materials development by coupling a supervised machine learning approach with a model agnostic, physics-informed data augmentation strategy using simulated data from the Inorganic Crystal Structure Database (ICSD) and experimental data. As a test case, 115 thin-film metal halides spanning 3 dimensionalities and 7 space-groups are synthesized and classified. After testing various algorithms, we develop and implement an all convolutional neural network, with cross validated accuracies for dimensionality and space-group classification of 93% and 89%, respectively. We propose average class activation maps, computed from a global average pooling layer, to allow high model interpretability by human experimentalists, elucidating the root causes of misclassification. Finally, we systematically evaluate the maximum XRD pattern step size (data acquisition rate) before loss of predictive accuracy occurs, and determine it to be 0.16{deg}, which enables an XRD pattern to be obtained and classified in 5.5 minutes or less.
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