A new principle of subwavelength imaging based on frequency scanning is considered. It is shown that it is possible to reconstruct the spatial profile of an external field exciting an array (or coupled arrays) of subwavelength-sized resonant particle
s with a frequency scan over the whole band of resonating array modes. During the scan it is enough to measure and store the values of the near field at one or at most two points. After the scan the distribution of the near field can be reconstructed with simple post-processing. The proposed near-field microscope has no moving parts.
