We have implemented a new experimental set-up for precise measurements of current fluctuations in three-terminal devices. The system operates at very low temperatures (30 mK) and is equipped with three SQUIDs as low noise current amplifiers. A SQUID
input coil is connected to each terminal of a sample allowing the acquisition of time-dependent current everywhere in the circuit. From these traces, we can measure the current mean value, the noise and cross-correlations between different branches of a device. In this paper we present calibration results of noise and cross-correlations obtained using low impedance macroscopic resistors. From these results we can extract the noise level of the set-up and show that there are no intrinsic correlations due to the measurement scheme. We also studied noise and correlations as a function of a DC current and estimated the electronic temperature of various macroscopic resistors.
We present measurements of current noise and cross-correlations in three-terminal Superconductor-Normal metal-Superconductor (S-N-S) nanostructures that are potential solid-state entanglers thanks to Andreev reflections at the N-S interfaces. The noi
se correlation measurements spanned from the regime where electron-electron interactions are relevant to the regime of Incoherent Multiple Andreev Reflection (IMAR). In the latter regime, negative cross-correlations are observed in samples with closely-spaced junctions.
