In this activity, students will make a working model of an atomic force microscope (AFM). A permanent magnet attached to a compact disc (CD) strip acts as the sensor. The sensor is attached to a base made from Legos. Laser light is reflected from the
CD sensor and onto a sheet of photosensitive paper. An array of permanent magnets attached to cardboard acts as the atoms on a surface. When the sensor is brought near this atomic surface the magnets will deflect the sensor, which in turn deflects the reflected laser. This deflection is recorded on the photosensitive paper, which students can take home with them.
The evolution in the surface morphology of epitaxial graphene films and 6H-SiC(0001) substrates is studied by electron channeling contrast imaging. Whereas film thickness is determined by growth temperature only, increasing growth times at constant t
emperature affect both internal stress and film morphology. Annealing times in excess of 8-10 minutes lead to an increase in the mean square roughness of SiC step edges to which graphene films are pinned, resulting in compressively stressed films at room temperature. Shorter annealing times produce minimal changes in the morphology of the terrace edges and result in nearly stress-free films upon cooling to room temperature.
