We have recently reported the successful fabrication of bright single-photon sources based on Ag-embedded nanocone structures that incorporate InAs quantum dots. The source had a photon collection efficiency as high as 24.6%. Here we show the results
of various types of photonic characterizations of the Ag-embedded nanocone structures that confirm their versatility as regards a broad range of quantum optical applications. We measure the first-order autocorrelation function to evaluate the coherence time of emitted photons, and the second-order correlation function, which reveals the strong suppression of multiple photon generation. The high indistinguishability of emitted photons is shown by the Hong-Ou-Mandel-type two-photon interference. With quasi-resonant excitation, coherent population flopping is demonstrated through Rabi oscillations. Extremely high single-photon purity with a $g^{(2)}$(0) value of 0.008 is achieved with $pi$-pulse quasi-resonant excitation.
Interference of a single photon generated from a single quantum dot is observed between two photon polarization modes. Each emitted single photon has two orthogonal polarization modes associated with the solid-state single photon source, in which two
non-degenerate neutral exciton states are involved. The interference between the two modes takes place only under the condition that the emitted photon is free from which-mode information.
A charge injection technique is applied to the X-ray CCD camera, XIS (X-ray Imaging Spectrometer) onboard Suzaku. The charge transfer inefficiency (CTI) in each CCD column (vertical transfer channel) is measured by the injection of charge packets int
o a transfer channel and subsequent readout. This paper reports the performances of the charge injection capability based on the ground experiments using a radiation damaged device, and in-orbit measurements of the XIS. The ground experiments show that charges are stably injected with the dispersion of 91eV in FWHM in a specific column for the charges equivalent to the X-ray energy of 5.1keV. This dispersion width is significantly smaller than that of the X-ray events of 113eV (FWHM) at approximately the same energy. The amount of charge loss during transfer in a specific column, which is measured with the charge injection capability, is consistent with that measured with the calibration source. These results indicate that the charge injection technique can accurately measure column-dependent charge losses rather than the calibration sources. The column-to-column CTI correction to the calibration source spectra significantly reduces the line widths compared to those with a column-averaged CTI correction (from 193eV to 173eV in FWHM on an average at the time of one year after the launch). In addition, this method significantly reduces the low energy tail in the line profile of the calibration source spectrum.
