Doping controlled Fano resonance in bilayer 1T$ ^{prime} $-ReS$ _{2} $: Raman experiments and first-principles theoretical analysis

In the bilayer ReS$ _{2} $ channel of a field-effect transistor (FET), we demonstrate using Raman spectroscopy that electron doping (n) results in softening of frequency and broadening of linewidth of the in-plane vibrational modes, leaving out-of-plane vibrational modes unaffected. Largest change is observed for the in-plane Raman mode at $sim$ 151 cm$^{-1} $, which also shows doping induced Fano resonance with the Fano parameter 1/q = -0.17 at doping concentration of $sim 3.7times10^{13}$ cm$^{-2} $. A quantitative understanding of our results is provided by first-principles density functional theory (DFT), showing that the electron-phonon coupling (EPC) of in-plane modes is stronger than that of out-of-plane modes, and its variation with doping is independent of the layer stacking. The origin of large EPC is traced to 1T to 1T$ ^{prime} $ structural phase transition of ReS$ _{2} $ involving in-plane displacement of atoms whose instability is driven by the nested Fermi surface of the 1T structure. Results are also compared with the isostructural trilayer ReSe$ _{2} $.

Symmetry induced phonon renormalization in few layers of 2H-MoTe$_2$ transistors: Raman and first-principles studies

Understanding of electron-phonon coupling (EPC) in two dimensional (2D) materials manifesting as phonon renormalization is essential to their possible applications in nanoelectronics. Here we report in-situ Raman measurements of electrochemically top-gated 2, 3 and 7 layered 2H-MoTe$ _{2} $ channel based field-effect transistors (FETs). While the E$ ^{1}_{2g} $ and B$ _{2g} $ phonon modes exhibit frequency softening and linewidth broadening with hole doping concentration (textit{p}) up to $sim$ 2.3 $times$10$ ^{13} $/cm$ ^{2} $, A$ _{1g}$ shows relatively small frequency hardening and linewidth sharpening. The dependence of frequency renormalization of the E$ ^{1}_{2g} $ mode on the number of layers in these 2D crystals confirms that hole doping occurs primarily in the top two layers, in agreement with recent predictions. We present first-principles density functional theory (DFT) analysis of bilayer MoTe$ _{2} $ that qualitatively captures our observations, and explain that a relatively stronger coupling of holes with E$ ^{1}_{2g} $ or B$ _{2g} $ modes as compared with the A$ _{1g} $ mode originates from the in-plane orbital character and symmetry of the states at valence band maximum (VBM). The contrast between the manifestation of EPC in monolayer MoS$ _{2} $ and those observed here in a few-layered MoTe$ _{2} $ demonstrates the role of the symmetry of phonons and electronic states in determining the EPC in these isostructural systems.

Raman spectroscopy of graphene on different substrates and influence of defects

We show the evolution of Raman spectra with number of graphene layers on different substrates, SiO$_{2}$/Si and conducting indium tin oxide (ITO) plate. The G mode peak position and the intensity ratio of G and 2D bands depend on the preparation of sample for the same number of graphene layers. The 2D Raman band has characteristic line shapes in single and bilayer graphene, capturing the differences in their electronic structure. The defects have a significant influence on the G band peak position for the single layer graphene: the frequency shows a blue shift upto 12 cm$^{-1}$ depending on the intensity of the D Raman band, which is a marker of the defect density. Most surprisingly, Raman spectra of graphene on the conducting ITO plates show a lowering of the G mode frequency by $sim$ 6 cm$^{-1}$ and the 2D band frequency by $sim$ 20 cm$^{-1}$. This red-shift of the G and 2D bands is observed for the first time in single layer graphene.