Phase dynamics in graphene-based Josephson junctions in the presence of thermal and correlated fluctuations

In this work we study by numerical methods the phase dynamics in ballistic graphene-based short Josephson junctions. The supercurrent through a graphene junction shows a non-sinusoidal phase-dependence, unlike a conventional junction ruled by the well-known d.c. Josephson relation. A superconductor-graphene-superconductor system exhibits superconductive quantum metastable states similar to those present in normal current-biased JJs. We explore the effects of thermal and correlated fluctuations on the escape time from these metastable states, when the system is stimulated by an oscillating bias current. As a first step, the analysis is carried out in the presence of an external Gaussian white noise source, which mimics the random fluctuations of the bias current. Varying the noise intensity, it is possible to analyze the behavior of the escape time from a superconductive metastable state in different temperature regimes. Noise induced phenomena, such as resonant activation and noise induced stability, are observed. The study is extended to the case of a coloured Gaussian noise source, analyzing how the escape time from the metastable state is affected by correlated random fluctuations for different values of the noise correlation time.

New insights into electron spin dynamics in the presence of correlated noise

The changes of the spin depolarization length in zinc-blende semiconductors when an external component of correlated noise is added to a static driving electric field are analyzed for different values of field strength, noise amplitude and correlation time. Electron dynamics is simulated by a Monte Carlo procedure which keeps into account all the possible scattering phenomena of the hot electrons in the medium and includes the evolution of spin polarization. Spin depolarization is studied by examinating the decay of the initial spin polarization of the conduction electrons through the Dyakonov-Perel process, the only relevant relaxation mechanism in III-V crystals. Our results show that, for electric field amplitude lower than the Gunn field, the dephasing length shortens with the increasing of the noise intensity. Moreover, a nonmonotonic behavior of spin depolarization length with the noise correlation time is found, characterized by a maximum variation for values of noise correlation time comparable with the dephasing time. Instead, in high field conditions, we find that, critically depending on the noise correlation time, external fluctuations can positively affect the relaxation length. The influence of the inclusion of the electron-electron scattering mechanism is also shown and discussed.

Noise induced phenomena in point Josephson junctions

We present the analysis of the mean switching time and its standard deviation of short overdamped Josephson junctions, driven by a direct current and a periodic signal. The effect of noise enhanced stability is investigated. It is shown that fluctuations may both decrease and increase the switching time.