We demonstrate that SrRuO3 and CaRuO3 thin films undergo a room temperature structural phase transition driven by the substrate imposed epitaxial biaxial strain. As tensile strain increases, ARuO3 (A=Ca, Sr) films transform from the orthorhombic phas
e which is usually observed in bulk SrRuO3 and CaRuO3 at room temperature, into a tetragonal phase which in bulk samples is only stable at higher temperatures. More importantly, we show that the observed phenomenon strongly affects the electronic and magnetic properties of ARuO3 thin films that are grown on different single crystal substrates which in turn offers the possibility to tune these properties.
Temperature dependent structural phase transitions of SrRuO3 thin films epitaxially grown on SrTiO3(001) single crystal substrates have been studied using high-resolution x-ray diffraction. In contrast to bulk SrRuO3, coherently strained epitaxial la
yers do not display cubic symmetry up to ~730 oC and remain tetragonal. Such behavior is believed to be induced by compressive strain between the SrRuO3 layer and SrTiO3 substrate due to lattice mismatch. The tetragonal symmetry during growth explains the single domain growth on miscut SrTiO3 substrates with step edges running along the [100] or [010] direction.
A reduction of polarization in ultra-thin ferroelectric films appears to be fundamental to ferroelectricity at the nanoscale. For the model system PbTiO3 on SrTiO3, we report observation of the polarization vs. thickness relation. Distinct periodicit
y changes of ferroelectric domains obtained from x-ray diffraction and total energy calculations reveal a linear lowering of the polarization below a critical thickness of ~12 nm. Independent polarization and tetragonality measurements provide insight into the fundamental relation between polarization and tetragonality in nanoscale ferroelectrics.
