The time-dependent non-crossing approximation is used to study the transient current in a single electron transistor attached asymmetrically to two leads following a sudden change in the energy of the dot level. We show that for asymmetric coupling,
sharp features in the density of states of the leads can induce oscillations in the current through the dot. These oscillations persist to much longer timescales than the timescale for charge fluctuations. The amplitude of the oscillations increases as the temperature or source-drain bias across the dot is reduced and saturates for values below the Kondo temperature. We discuss the microscopic origin of these oscillations and comment on the possibility for their experimental detection.
