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Register a new userFilms of Mn12-acetate by Pulsed Laser Evaporation
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Added by
Meenakshi Viswanathan
Publication date
2004
fields
Physics
and research's language is
English
Authors
V. Meenakshi
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Films of the molecular nanomagnet, Mn12-acetate, have been deposited using pulsed laser deposition and a novel variant, matrix assisted pulsed laser evaporation. The films have been characterized by X-ray photoelectron spectroscopy, mass spectrometry and magnetic hysteresis. The results indicate that an increase in laser energy and/or pulse frequency leads to fragmentation of Mn12, whereas its chemical and magnetic integrity is preserved at low laser energy (200 mJ). This technique allows the fabrication of patterned thin film systems of molecular nanomagnets for fundamental and applied experiments.
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Thin films of the molecular magnet Mn12-acetate, [Mn12 O12(CH3COO)16 (H2O)4] 2CH3COOH 4H2O, have been prepared using a laser ablation technique with a nitrogen laser at low laser energies of 0.8 and 2 mJ. Chemical and magnetic characterizations show that the Mn12-acetate cores remain intact and the films show similar magnetic properties to those of the parent molecular starting material. In addition, the magnetic data exhibit a peak in the magnetization at 27 K indicating the creation of an additional magnetic phase not noted in previous studies of crystalline phases.
We demonstrate a straightforward way to lithographically fabricate Mn12-acetate (Mn12O12(CH3COO)16(H2O)4 2CH3COOH 4H2O) thin film patterns on Si/SiO2 surfaces, a significant step in light of the chemical volatility of this organic complex. Atomic force microscopy (AFM) images of the film patterns allow the determination of the pattern dimensions. X-ray photoelectron spectroscopy (XPS) data indicate that the patterned material is the intact Mn12-acetate complex. Magnetic measurements of the Mn12-acetate film confirm that the film properties are reminiscent of crystalline Mn12-acetate, suggesting that this approach can be used to fabricate lithographically patterned devices of Mn12-acetate.
Micron-thick boron films have been deposited by Pulsed Laser Deposition in vacuum on several substrates at room temperature. The use of high energy pulses (>700 mJ) results in the deposition of smooth coatings with low oxygen uptake even at base pressures of 10$^{-4}$ - 10$^{-3}$ Pa. A detailed structural analysis, by X-Ray Diffraction and Raman, allowed to assess the amorphous nature of the deposited films as well as to determine the base pressure that prevents boron oxide formation. In addition the crystallization dynamics has been characterized showing that film crystallinity already improves at relatively low temperatures (800 {deg}C). Elastic properties of the boron films have been determined by Brillouin spectroscopy. Finally, micro-hardness tests have been used to explore cohesion and hardness of B films deposited on aluminum, silicon and alumina. The reported deposition strategy allows the growth of reliable boron coatings paving the way for their use in many technology fields.
Using micron-sized thermometers and Hall bars, we report time-resolved studies of the local temperature and local magnetization for two types of magnetic avalanches (abrupt spin reversals) in the molecular magneti Mn12-acetate, corresponding to avalanches of the main slow-relaxing crystalline form and avalanches of the fast-relaxing minor species that exists in all as-grown crystals of this material. An experimental protocol is used that allows the study of each type of avalanche without triggering avalanches in the other, and of both types of avalanches simultaneously. In samples prepared magnetically to enable both types of avalanches, minor species avalanches are found to act as a catalyst for the major species avalanches. magnetically to enable both types of avalanches, minor species avalanches are found to act as a catalyst for the major species avalanches.
Epitaxial titanium diboride thin films have been deposited on sapphire substrates by Pulsed Laser Ablation technique. Structural properties of the films have been studied during the growth by Reflection High Energy Electron Diffraction (RHEED) and ex-situ by means of X-ray diffraction techniques; both kinds of measurements indicate a good crystallographic orientation of the TiB2 film both in plane and along the c axis. A flat surface has been observed by Atomic Force Microscopy imaging. Electrical resistivity at room temperature resulted to be five times higher than the value reported for single crystals. The films resulted to be also very stable at high temperature, which is very promising for using this material as a buffer layer in the growth of magnesium diboride thin films.
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