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The advantages of convergent beam electron diffraction for symmetry determination at the scale of a few nm are well known. In practice, the approach is often limited due to the restriction on the angular range of the electron beam imposed by the small Bragg angle for high energy electron diffraction, i.e. a large convergence angle of the incident beam results in overlapping information in the diffraction pattern. Techniques have been generally available since the 1980s which overcome this restriction for individual diffracted beams, by making a compromise between illuminated area and beam convergence. Here, we describe a simple technique which overcomes all of these problems using computer control, giving electron diffraction data over a large angular range for many diffracted beams from the volume given by a focused electron beam (typically a few nm or less). The increase in the amount of information significantly improves ease of interpretation and widens the applicability of the technique, particularly for thin materials or those with larger lattice parameters.
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The epitaxial growth of complex oxide thin films provide three avenues to generate unique properties: the ability to influence the 3-dimensional structure of the film, the presence of a surface, and the generation of an interface. In all three cases, a clear understanding of the resulting atomic structure is desirable. However, determining the full structure of an epitaxial thin film (lattice parameters, space group, atomic positions, surface reconstructions) on a routine basis is a serious challenge. In this paper we highlight the remarkable information that can be extracted from both the Bragg scattering and inelastic multiple scattering events that occur during Reflection High Energy Electron Diffraction. We review some methods to extract structural information and show how mature techniques used in other fields can be directly applied to the {em in-situ} and real-time diffraction images of a growing film. These collection of techniques give access to both the epitaxially influenced 3 dimensional bulk structure of the film, and any reconstructions that may happen at the surface.
Neutron diffraction has been used to investigate antiferromagnetism since 1949. Here we show that antiferromagnetic reflections can also be seen in transmission electron diffraction patterns from NiO. The diffraction patterns taken here came from regions as small as 10.5 nm and such patterns could be used to form an image of the antiferromagnetic structure with a nanometre resolution.
Current unsupervised anomaly localization approaches rely on generative models to learn the distribution of normal images, which is later used to identify potential anomalous regions derived from errors on the reconstructed images. However, a main limitation of nearly all prior literature is the need of employing anomalous images to set a class-specific threshold to locate the anomalies. This limits their usability in realistic scenarios, where only normal data is typically accessible. Despite this major drawback, only a handful of works have addressed this limitation, by integrating supervision on attention maps during training. In this work, we propose a novel formulation that does not require accessing images with abnormalities to define the threshold. Furthermore, and in contrast to very recent work, the proposed constraint is formulated in a more principled manner, leveraging well-known knowledge in constrained optimization. In particular, the equality constraint on the attention maps in prior work is replaced by an inequality constraint, which allows more flexibility. In addition, to address the limitations of penalty-based functions we employ an extension of the popular log-barrier methods to handle the constraint. Comprehensive experiments on the popular BRATS19 dataset demonstrate that the proposed approach substantially outperforms relevant literature, establishing new state-of-the-art results for unsupervised lesion segmentation.
Precession Electron Diffraction (PED) offers a number of advantages for crystal structure analysis and solving unknown structures using electron diffraction. The current article uses many-beam simulations of PED intensities, in combination with model structures, to arrive at a better understanding of how PED differs from standard unprecessed electron diffraction. It is shown that precession reduces the chaotic oscillatory behavior of electron diffraction intensities as a function of thickness. An additional characteristic of PED which is revealed by simulations is reduced sensitivity to structure factor phases. This is shown to be a general feature of dynami-cal intensities collected under conditions in which patterns with multiple incident beam orienta-tions are averaged together. A new and significantly faster method is demonstrated for dynami-cal calculations of PED intensities, based on using information contained in off-central columns of the scattering matrix.
A DigitalMicrograph script InsteaDMatic has been developed to facilitate rapid automated continuous rotation electron diffraction (cRED) data acquisition. The script coordinates microscope functions, such as stage rotation, camera functions relevant for data collection, and stores the experiment metadata. The script is compatible with any microscope that can be controlled by DigitalMicrograph and has been tested on both JEOL and Thermo Fisher Scientific microscopes. A proof-of-concept has been performed through employing InsteaDMatic for data collection and structure determination of a ZSM-5 zeolite. The influence of illumination settings and electron dose rate on the quality of diffraction data, unit cell determination and structure solution has been investigated in order to optimize the data acquisition procedure.
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