No Arabic abstract
Consider two Fermi gases with the same {it average} currents: a transport gas, as in solid-state experiments where the chemical potentials of terminal 1 is $mu+eV$ and of terminal 2 and 3 is $mu$, and a beam, i.e., electrons entering only from terminal 1 having energies between $mu$ and $mu+eV$. By expressing the current noise as a sum over single-particle transitions we show that the temporal current fluctuations are very different: The beam is noisier due to allowed single-particle transitions into empty states below $mu$. Surprisingly, the correlations between terminals 2 and 3 are the same.
We analyze an AC-driven dimer chain connected to a strongly biased electron source and drain. It turns out that the resulting transport exhibits fingerprints of topology. They are particularly visible in the driving-induced current suppression and the Fano factor. Thus, shot noise measurements provide a topological phase diagram as a function of the driving parameters. The observed phenomena can be explained physically by a mapping to an effective time-independent Hamiltonian and the emergence of edge states. Moreover, by considering quantum dissipation, we determine the requirements for the coherence properties in a possible experimental realization. For the computation of the zero-frequency noise, we develop an efficient method based on matrix-continued fractions.
A fractional quasiparticle charge is a manifestation of strong interactions in the fractional quantum Hall effect. Nevertheless, shot noise of quasiparticles is well described by a formula, derived for noninteracting charges. We explain the success of that formula by proving that in the limits of strong and weak backscattering it holds irrespectively of microscopic details in weakly and strongly interacting systems alike. The derivation relies only on principles of statistical mechanics. We also derive an approximate model-independent formula for shot noise in the regime of intermediate backscattering. The equation is numerically close to the standard `noninteracting fitting formula but suggests a different physical interpretation of the experimental results. We verify our theoretical predictions with a shot noise experiment at the filling factor $3/5$.
We report measurements of current noise in single- and multi-layer graphene devices. In four single-layer devices, including a p-n junction, the Fano factor remains constant to within +/-10% upon varying carrier type and density, and averages between 0.35 and 0.38. The Fano factor in a multi-layer device is found to decrease from a maximal value of 0.33 at the charge-neutrality point to 0.25 at high carrier density. These results are compared to theoretical predictions for shot noise in ballistic and disordered graphene.
Magnetic molecules and nanomagnets can be used to influence the electronic transport in mesoscopic junction. In a magnetic field the precessional motion leads to resonances in the dc- and ac-transport properties of a nanocontact, in which the electrons are coupled to the precession. Quantities like the dc-conductance or the ac-response provide valuable information like the level structure and the coupling parameters. Here, we address the current noise properties of such contacts. This encompasses the charge current and spin-torque shot noise, which both show a step-like behavior as functions of bias voltage and magnetic field. The charge current noise shows pronounced dips around the steps, which we trace back to interference effects of electron in quasienergy levels coupled by the molecular spin precession. We show that some components of the noise of the spin-torque currents are directly related to the Gilbert damping and, hence, are experimentally accessible. Our results show that the noise characteristics allow to investigate in more detail the coherence of spin transport in contacts containing magnetic molecules.
We investigate the current noise in HgTe-based quantum wells with an inverted band structure in the regime of disordered edge transport. Consistent with previous experiments, the edge resistance strongly exceeds $h/e^2$ and weakly depends on the temperature. The shot noise is well below the Poissonian value and characterized by the Fano factor with gate voltage and sample to sample variations in the range $0.1<F<0.3$. Given the fact that our devices are shorter than the most pessimistic estimate of the ballistic dephasing length, these observations exclude the possibility of one-dimensional helical edge transport. Instead, we suggest that a disordered multi-mode conduction is responsible for the edge transport in our experiment.