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Quantifying the Coherent Interaction Length of Second-Harmonic Microscopy in Lithium Niobate Confined Nanostructures

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 Added by Michael R\\\"using
 Publication date 2021
  fields Physics
and research's language is English




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Thin-film lithium niobate (TFLN) in the form of x- or z-cut lithium-niobate-on-insulator (LNOI) has recently popped up as a very promising and novel platform for developing integrated optoelectronic (nano)devices and exploring fundamental research. Here, we investigate the coherent interaction length $l_{c}$ of optical second-harmonic (SH) microscopy in such samples, that are purposely prepared into a wedge shape, in order to elegantly tune the geometrical confinement from bulk thicknesses down to $approx$ 50 nm. SH microscopy is a very powerful and non-invasive tool for the investigation of structural properties in the biological and solid-state sciences, especially also for visualizing and analyzing ferroelectric domains and domain walls. However, unlike bulk LN, SH microscopy in TFLN is largely affected by interfacial reflections and resonant enhancement that both rely on film thickness and substrate material. In this paper we show that the dominant SHG contribution measured in back-reflection, is the co-propagating phase-matched SH signal and textit{not} the counter-propagating SH portion as is the case for bulk LN samples. Moreover, $l_{c}$ dramatically depends also on the incident pump laser wavelength (sample dispersion) but even more on the numerical aperture of the focussing objective in use. These experimental findings on x- and z-cut TFLN are excellently backed up by our advanced numerical simulations.



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Thin film lithium niobate is of great recent interest and an understanding of periodically poled thin-films is crucial for both fundamental physics and device developments. Second-harmonic (SH) microscopy allows for the non-invasive visualization and analysis of ferroelectric domain structures and walls. While the technique is well understood in bulk lithium niobate, SH microscopy in thin films is largely influenced by interfacial reflections and resonant enhancements, which depend on film thicknesses and the substrate materials. We present a comprehensive analysis of SH microscopy in x-cut lithium niobate thin films, based on a full three dimensional focus calculations, and accounting for interface reflections. We show that the dominant signal in back-reflection originates from a co-propagating phase-matched process observed through reflections, rather than direct detection of the counter-propagating signal as in bulk samples. We can explain the observation of domain structures in the thin film geometry, and in particular, we show that the SH signal from thin poled films allows to unambiguously distinguish areas, which are completely or only partly inverted in depth.
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