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Register a new userProbing the bright exciton state in twisted bilayer graphene via resonant Raman scattering
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The band structure of bilayer graphene is tunable by introducing a relative twist angle between the two layers, unlocking exotic phases, such as superconductor and Mott insulator, and providing a fertile ground for new physics. At intermediate twist angles around 10{deg}, highly degenerate electronic transitions hybridize to form excitonic states, a quite unusual phenomenon in a metallic system. We probe the bright exciton mode using resonant Raman scattering measurements to track the evolution of the intensity of the graphene Raman G peak, corresponding to the E2g phonon. By cryogenically cooling the sample, we are able to resolve both the incoming and outgoing resonance in the G peak intensity evolution as a function of excitation energy, a prominent manifestation of the bright exciton serving as the intermediate state in the Raman process. For a sample with twist angle 8.6{deg}, we report a weakly temperature dependent resonance broadening ${gamma}$ ${approx}$ 0.07 eV. In the limit of small inhomogeneous broadening, the observed ${gamma}$ places a lower bound for the bright exciton scattering lifetime at 10 fs in the presence of charges and excitons excited by the light pulse for Raman measurement, limited by the rapid exciton-exciton and exciton-charge scattering in graphene.
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The line shape of the double-resonant $2D$ Raman mode in bilayer graphene is often considered to be characteristic for a certain laser excitation energy. Here, in a joint experimental and theoretical study, we analyze the dependence of the double-resonant Raman scattering processes in bilayer graphene on the electronic broadening parameter $gamma$. We demonstrate that the ratio between symmetric and anti-symmetric scattering processes sensitively depends on the lifetime of the electronic states, explaining the experimentally observed variation of the complex $2D$-mode line shape.
Flat-band systems are a promising platform for realizing exotic collective ground states with spontaneously broken symmetry because the electron-electron interactions dominate the kinetic energy. A state of particular interest would be the chased after interlayer-phase-coherent exciton condensate but the conventional treatments of the effect of thermal and quantum fluctuations suggest that this state might be either unstable or fragile. In this work, using double twisted bilayer graphene heterostructures as an example, we show that the quantum metric of the Bloch wave functions can strongly stabilize the exciton condensate and reverse the conclusion that one would draw using a conventional approach. The quantum metric contribution arises from interband terms, and flat-bands are most commonly realized by engineering multiband systems. Our results therefore suggest that in many practical situations the quantum metric can play a critical role in determining the stability of exciton condensates in double layers formed by two-dimensional systems with flat-bands.
We theoretically calculate the impurity-scattering induced resistivity of twisted bilayer graphene at low twist angles where the graphene Fermi velocity is strongly suppressed. We consider, as a function of carrier density, twist angle, and temperature, both long-ranged Coulomb scattering and short-ranged defect scattering within a Boltzmann theory relaxation time approach. For experimentally relevant disorder, impurity scattering contributes a resistivity comparable to (much larger than) the phonon scattering contribution at high (low) temperatures. Decreasing twist angle leads to larger resistivity, and in general, the resistivity increases (decreases) with increasing temperature (carrier density). Inclusion of the van Hove singularity in the theory leads to a strong increase in the resistivity at higher densities, where the chemical potential is close to a van Hove singularity, leading to an apparent density-dependent plateau type structure in the resistivity, which has been observed in recent transport experiments. We also show that the Matthissens rule is strongly violated in twisted bilayer graphene at low twist angles.
The electronic structure of bilayer graphene is investigated from a resonant Raman study using different laser excitation energies. The values of the parameters of the Slonczewski-Weiss-McClure model for graphite are measured experimentally and some of them differ significantly from those reported previously for graphite, specially that associated with the difference of the effective mass of electrons and holes. The splitting of the two TO phonon branches in bilayer graphene is also obtained from the experimental data. Our results have implications for bilayer graphene electronic devices.
The dispersion of phonons and the electronic structure of graphene systems can be obtained experimentally from the double-resonance (DR) Raman features by varying the excitation laser energy. In a previous resonance Raman investigation of graphene, the electronic structure was analyzed in the framework of the Slonczewski-Weiss-McClure (SWM) model, considering the outer DR process. In this work we analyze the data considering the inner DR process, and obtain SWM parameters that are in better agreement with those obtained from other experimental techniques. This result possibly shows that there is still a fundamental open question concerning the double resonance process in graphene systems.
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