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Register a new userZero-sample surface defect detection and classification based on semantic feedback neural network
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Added by
Yibo Guo
Publication date
2021
fields
Informatics Engineering
and research's language is
English
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Defect detection and classification technology has changed from traditional artificial visual inspection to current intelligent automated inspection, but most of the current defect detection methods are training related detection models based on a data-driven approach, taking into account the difficulty of collecting some sample data in the industrial field. We apply zero-shot learning technology to the industrial field. Aiming at the problem of the existing Latent Feature Guide Attribute Attention (LFGAA) zero-shot image classification network, the output latent attributes and artificially defined attributes are different in the semantic space, which leads to the problem of model performance degradation, proposed an LGFAA network based on semantic feedback, and improved model performance by constructing semantic embedded modules and feedback mechanisms. At the same time, for the common domain shift problem in zero-shot learning, based on the idea of co-training algorithm using the difference information between different views of data to learn from each other, we propose an Ensemble Co-training algorithm, which adaptively reduces the prediction error in image tag embedding from multiple angles. Various experiments conducted on the zero-shot dataset and the cylinder liner dataset in the industrial field provide competitive results.
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The defect detection task can be regarded as a realistic scenario of object detection in the computer vision field and it is widely used in the industrial field. Directly applying vanilla object detector to defect detection task can achieve promising results, while there still exists challenging issues that have not been solved. The first issue is the texture shift which means a trained defect detector model will be easily affected by unseen texture, and the second issue is partial visual confusion which indicates that a partial defect box is visually similar with a complete box. To tackle these two problems, we propose a Reference-based Defect Detection Network (RDDN). Specifically, we introduce template reference and context reference to against those two problems, respectively. Template reference can reduce the texture shift from image, feature or region levels, and encourage the detectors to focus more on the defective area as a result. We can use either well-aligned template images or the outputs of a pseudo template generator as template references in this work, and they are jointly trained with detectors by the supervision of normal samples. To solve the partial visual confusion issue, we propose to leverage the carried context information of context reference, which is the concentric bigger box of each region proposal, to perform more accurate region classification and regression. Experiments on two defect detection datasets demonstrate the effectiveness of our proposed approach.
Fingerprint classification is an effective technique for reducing the candidate numbers of fingerprints in the stage of matching in automatic fingerprint identification system (AFIS). In recent years, deep learning is an emerging technology which has achieved great success in many fields, such as image processing, natural language processing and so on. In this paper, we only choose the orientation field as the input feature and adopt a new method (stacked sparse autoencoders) based on depth neural network for fingerprint classification. For the four-class problem, we achieve a classification of 93.1 percent using the depth network structure which has three hidden layers (with 1.8% rejection) in the NIST-DB4 database. And then we propose a novel method using two classification probabilities for fuzzy classification which can effectively enhance the accuracy of classification. By only adjusting the probability threshold, we get the accuracy of classification is 96.1% (setting threshold is 0.85), 97.2% (setting threshold is 0.90) and 98.0% (setting threshold is 0.95). Using the fuzzy method, we obtain higher accuracy than other methods.
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Surface defect detection plays an increasingly important role in manufacturing industry to guarantee the product quality. Many deep learning methods have been widely used in surface defect detection tasks, and have been proven to perform well in defects classification and location. However, deep learning-based detection methods often require plenty of data for training, which fail to apply to the real industrial scenarios since the distribution of defect categories is often imbalanced. In other words, common defect classes have many samples but rare defect classes have extremely few samples, and it is difficult for these methods to well detect rare defect classes. To solve the imbalanced distribution problem, in this paper we propose TL-SDD: a novel Transfer Learning-based method for Surface Defect Detection. First, we adopt a two-phase training scheme to transfer the knowledge from common defect classes to rare defect classes. Second, we propose a novel Metric-based Surface Defect Detection (M-SDD) model. We design three modules for this model: (1) feature extraction module: containing feature fusion which combines high-level semantic information with low-level structural information. (2) feature reweighting module: transforming examples to a reweighting vector that indicates the importance of features. (3) distance metric module: learning a metric space in which defects are classified by computing distances to representations of each category. Finally, we validate the performance of our proposed method on a real dataset including surface defects of aluminum profiles. Compared to the baseline methods, the performance of our proposed method has improved by up to 11.98% for rare defect classes.
Accurate insect pest recognition is significant to protect the crop or take the early treatment on the infected yield, and it helps reduce the loss for the agriculture economy. Design an automatic pest recognition system is necessary because manual recognition is slow, time-consuming, and expensive. The Image-based pest classifier using the traditional computer vision method is not efficient due to the complexity. Insect pest classification is a difficult task because of various kinds, scales, shapes, complex backgrounds in the field, and high appearance similarity among insect species. With the rapid development of deep learning technology, the CNN-based method is the best way to develop a fast and accurate insect pest classifier. We present different convolutional neural network-based models in this work, including attention, feature pyramid, and fine-grained models. We evaluate our methods on two public datasets: the large-scale insect pest dataset, the IP102 benchmark dataset, and a smaller dataset, namely D0 in terms of the macro-average precision (MPre), the macro-average recall (MRec), the macro-average F1- score (MF1), the accuracy (Acc), and the geometric mean (GM). The experimental results show that combining these convolutional neural network-based models can better perform than the state-of-the-art methods on these two datasets. For instance, the highest accuracy we obtained on IP102 and D0 is $74.13%$ and $99.78%$, respectively, bypassing the corresponding state-of-the-art accuracy: $67.1%$ (IP102) and $98.8%$ (D0). We also publish our codes for contributing to the current research related to the insect pest classification problem.
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