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Register a new userMeasurement of the miscut angle in the determination of the Si lattice parameter
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The measurement of the angle between the interferometer front mirror and the diffracting planes is a critical aspect of the Si lattice-parameter measurement by combined x-ray and optical interferometry. In addition to being measured off-line by x-ray diffraction, it was checked on-line by transversely moving the analyser crystal and observing the phase shift of the interference fringe. We describe the measurement procedure and give the miscut angle of the $^{28}$Si crystal whose lattice parameter was an essential input-datum for, yesterday, the determination of the Avogadro constant and, today, the kilogram realisation by counting atoms. These data are a kindness to others that might wish to repeat the measurement of the lattice-parameter of this unique crystal.
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In 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms and by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of $^{28}$Si {220} lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value $d_{220}=192014711.98(34)$ am having a reduced uncertainty.
We present different computational approaches for the rapid extraction of the signal parameters of discretely sampled damped sinusoidal signals. We compare time- and frequency-domain-based computational approaches in terms of their accuracy and precision and computational time required in estimating the frequencies of such signals, and observe a general trade-off between precision and speed. Our motivation is precise and rapid analysis of damped sinusoidal signals as these become relevant in view of the recent experimental developments in cavity-enhanced polarimetry and ellipsometry, where the relevant time scales and frequencies are typically within the $sim1-10,mu$s and $sim1-100$MHz ranges, respectively. In such experimental efforts, single-shot analysis with high accuracy and precision becomes important when developing experiments that study dynamical effects and/or when developing portable instrumentations. Our results suggest that online, running-fashion, microsecond-resolved analysis of polarimetric/ellipsometric measurements with fractional uncertainties at the $10^{-6}$ levels, is possible, and using a proof-of-principle experimental demonstration we show that using a frequency-based analysis approach we can monitor and analyze signals at kHz rates and accurately detect signal changes at microsecond time-scales.
Contact angle is an important parameter in characterizing the wetting properties of fluids. The most common methods for measuring the contact angle is to measure it directly from the profile curve of a sessile drop, a method with certain inherent drawbacks. Here we describe an alternative method that uses the height and volume of a sessile drop as constraints to construct its profile by numerical integration of its two governing differential equations. The integration yields, self consistently, the average value of the contact angle along the entire contact line as well as the footprint radius of the drop and its crown radius of curvature. As a test case, the new method is used to obtain the contact angle of pure water on two different substrates, Teflon and Lucite. For each substrate, four drops ranging in volume from 10 {mu}l to 40 {mu}l are used. The computed contact angles are consistent across the four different drop sizes for each substrate and are in agreement with typical literature values.
The atomic mass difference of 163Ho and 163Dy has been directly measured with the Penning trap mass spectrometer SHIPTRAP applying the novel phase imaging ion cyclotron resonance technique. Our measurement has solved the long standing problem of large discrepancies in the Q value of the electron capture in 163Ho determined by different techniques. Our measured mass difference shifts the current Q value of 2555(16) eV evaluated in the Atomic Mass Evaluation 2012 [G. Audi et al., Chin. Phys. C 36, 1157 (2012)] by more than 7 sigma to 2833(30stat)(15sys) eV/c2. With the new mass difference it will be possible, e.g., to reach in the first phase of the ECHo experiment a statistical sensitivity to the neutrino mass below 10 eV, which will reduce its present upper limit by more than an order of magnitude.
Here we present the specifications of the newly developed beta-spectrometer based on thick full absorption Si(Li) detector. The spectrometer can be used for precision measurements of various beta-spectra, namely for the beta-spectrum shape study of $^{144}$Pr, which is considered to be the most promising anti-neutrino source for sterile neutrino searches.
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