No Arabic abstract
We consider an oscillator model to describe qualitatively friction force for an atomic force mi-croscope (AFM) tip driven on a surface described by periodic potential. It is shown that average value of the friction force could be controlled by application of external time-dependent periodic perturbation. Numerical simulation demonstrates significant drop or increase of friction depending on amplitude and frequency of perturbation. Two different oscillating regimes are observed, they determined by frequency and amplitude of perturbation. The first one is regime of mode locking at frequencies multiple to driving frequency. It occurs close to resonance of harmonic perturbation and driving frequencies. Another regime of motion for a driven oscillator is characterized by aperiodic oscillations. It was observed in the numerical experiment for perturbations with large amplitudes and frequencies far from oscillator eigenfrequency. In this regime the oscillator does not follow external driving force, but rather oscillates at several modes which result from interaction of oscillator eigenmode and perturbation frequency.
In this activity, students will make a working model of an atomic force microscope (AFM). A permanent magnet attached to a compact disc (CD) strip acts as the sensor. The sensor is attached to a base made from Legos. Laser light is reflected from the CD sensor and onto a sheet of photosensitive paper. An array of permanent magnets attached to cardboard acts as the atoms on a surface. When the sensor is brought near this atomic surface the magnets will deflect the sensor, which in turn deflects the reflected laser. This deflection is recorded on the photosensitive paper, which students can take home with them.
We are concerned with free energy analysis of the system comprising an AFM tip, water meniscus, and polymer film. Under applied electrostatic potential, the minimum in free energy is at a distance greater than the initial tip--substrate separation in the absence of potential. This equilibrium distance, t_0, mostly depends on the tip bias V and cantilever spring constant k_s, where as variations of t_0 is less pronounced with respect to the dielectric constants, and polymer film thickness. Polarization of water meniscus under the AFM tip appears to be the dominant factor enabling the creation of mechanical work for tip retraction.
An atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining a narrow trench. We found a reversible behavior in the electrical resistance which we attribute to the movement of dislocations. After several attempts also permanent changes are observed. Two theoretical approaches are presented to approximate the measured resistance.
We propose a theoretical framework for reconstructing tip-surface interactions using the intermodulation technique when more than one eigenmode is required to describe the cantilever motion. Two particular cases of bimodal motion are studied numerically: one bending and one torsional mode, and two bending modes. We demonstrate the possibility of accurate reconstruction of a two-dimensional conservative force field for the former case, while dissipative forces are studied for the latter.
We use an atomic force microscope (AFM) to manipulate graphene films on a nanoscopic length scale. By means of local anodic oxidation with an AFM we are able to structure isolating trenches into single-layer and few-layer graphene flakes, opening the possibility of tabletop graphene based device fabrication. Trench sizes of less than 30 nm in width are attainable with this technique. Besides oxidation we also show the influence of mechanical peeling and scratching with an AFM of few layer graphene sheets placed on different substrates.