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Testing Determinantal Point Processes

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 Added by Khashayar Gatmiry
 Publication date 2020
and research's language is English




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Determinantal point processes (DPPs) are popular probabilistic models of diversity. In this paper, we investigate DPPs from a new perspective: property testing of distributions. Given sample access to an unknown distribution $q$ over the subsets of a ground set, we aim to distinguish whether $q$ is a DPP distribution, or $epsilon$-far from all DPP distributions in $ell_1$-distance. In this work, we propose the first algorithm for testing DPPs. Furthermore, we establish a matching lower bound on the sample complexity of DPP testing. This lower bound also extends to showing a new hardness result for the problem of testing the more general class of log-submodular distributions.

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Semi-parametric regression models are used in several applications which require comprehensibility without sacrificing accuracy. Typical examples are spline interpolation in geophysics, or non-linear time series problems, where the system includes a linear and non-linear component. We discuss here the use of a finite Determinantal Point Process (DPP) for approximating semi-parametric models. Recently, Barthelme, Tremblay, Usevich, and Amblard introduced a novel representation of some finite DPPs. These authors formulated extended L-ensembles that can conveniently represent partial-projection DPPs and suggest their use for optimal interpolation. With the help of this formalism, we derive a key identity illustrating the implicit regularization effect of determinantal sampling for semi-parametric regression and interpolation. Also, a novel projected Nystrom approximation is defined and used to derive a bound on the expected risk for the corresponding approximation of semi-parametric regression. This work naturally extends similar results obtained for kernel ridge regression.
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