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Multiple-criteria Based Active Learning with Fixed-size Determinantal Point Processes

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 Added by Xueying Zhan
 Publication date 2021
and research's language is English




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Active learning aims to achieve greater accuracy with less training data by selecting the most useful data samples from which it learns. Single-criterion based methods (i.e., informativeness and representativeness based methods) are simple and efficient; however, they lack adaptability to different real-world scenarios. In this paper, we introduce a multiple-criteria based active learning algorithm, which incorporates three complementary criteria, i.e., informativeness, representativeness and diversity, to make appropriate selections in the active learning rounds under different data types. We consider the selection process as a Determinantal Point Process, which good balance among these criteria. We refine the query selection strategy by both selecting the hardest unlabeled data sample and biasing towards the classifiers that are more suitable for the current data distribution. In addition, we also consider the dependencies and relationships between these data points in data selection by means of centroidbased clustering approaches. Through evaluations on synthetic and real-world datasets, we show that our method performs significantly better and is more stable than other multiple-criteria based AL algorithms.



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195 - Khashayar Gatmiry 2020
Determinantal point processes (DPPs) are popular probabilistic models of diversity. In this paper, we investigate DPPs from a new perspective: property testing of distributions. Given sample access to an unknown distribution $q$ over the subsets of a ground set, we aim to distinguish whether $q$ is a DPP distribution, or $epsilon$-far from all DPP distributions in $ell_1$-distance. In this work, we propose the first algorithm for testing DPPs. Furthermore, we establish a matching lower bound on the sample complexity of DPP testing. This lower bound also extends to showing a new hardness result for the problem of testing the more general class of log-submodular distributions.
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