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Register a new userA deep learning approach for determining the chiral indices of carbon nanotubes from high-resolution transmission electron microscopy images
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Added by
Georg Daniel F\\\"orster
Publication date
2020
fields
Physics
and research's language is
English
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Chiral indices determine important properties of carbon nanotubes (CNTs). Unfortunately, their determination from high-resolution transmission electron microscopy (HRTEM) images, the most accurate method for assigning chirality, is a tedious task. We develop a Convolutional Neural Network that automatizes this process. A large and realistic training data set of CNT images is obtained by means of atomistic computer simulations coupled with the multi-slice approach for image generation. In most cases, results of the automated assignment are in excellent agreement with manual classification, and the origin of failures is identified. The current approach, which combines HRTEM imaging and deep learning algorithms allows the analysis of a statistically significant number of HRTEM images of carbon nanotubes, paving the way for robust estimates of experimental chiral distributions.
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Recording atomic-resolution transmission electron microscopy (TEM) images is becoming increasingly routine. A new bottleneck is then analyzing this information, which often involves time-consuming manual structural identification. We have developed a deep learning-based algorithm for recognition of the local structure in TEM images, which is stable to microscope parameters and noise. The neural network is trained entirely from simulation but is capable of making reliable predictions on experimental images. We apply the method to single sheets of defected graphene, and to metallic nanoparticles on an oxide support.
We present the development of the first ultrafast transmission electron microscope (UTEM) driven by localized photoemission from a field emitter cathode. We describe the implementation of the instrument, the photoemitter concept and the quantitative electron beam parameters achieved. Establishing a new source for ultrafast TEM, the Gottingen UTEM employs nano-localized linear photoemission from a Schottky emitter, which enables operation with freely tunable temporal structure, from continuous wave to femtosecond pulsed mode. Using this emission mechanism, we achieve record pulse properties in ultrafast electron microscopy of 9 {AA} focused beam diameter, 200 fs pulse duration and 0.6 eV energy width. We illustrate the possibility to conduct ultrafast imaging, diffraction, holography and spectroscopy with this instrument and also discuss opportunities to harness quantum coherent interactions between intense laser fields and free electron beams.
Single atoms can be considered as basic objects for electron microscopy to test the microscope performance and basic concepts for modeling of image contrast. In this work high-resolution transmission electron microscopy was applied to image single platinum atoms in an aberration-corrected transmission electron microscope. The atoms are deposited on a self-assembled monolayer substrate which induces only negligible contrast. Single-atom contrast simulations were performed on the basis of Weickenmeier-Kohl and Doyle-Turner scattering factors. Experimental and simulated intensities are in full agreement on an absolute scale.
Optical diffraction tomography (ODT) reconstructs a samples volumetric refractive index (RI) to create high-contrast, quantitative 3D visualizations of biological samples. However, standard implementations of ODT use interferometric systems, and so are sensitive to phase instabilities, complex mechanical design, and coherent noise. Furthermore, their reconstruction framework is typically limited to weakly-scattering samples, and thus excludes a whole class of multiple-scattering samples. Here, we implement a new 3D RI microscopy technique that utilizes a computational multi-slice beam propagation method to invert the optical scattering process and reconstruct high-resolution (NA>1.0) 3D RI distributions of multiple-scattering samples. The method acquires intensity-only measurements from different illumination angles, and then solves a non-linear optimization problem to recover the sample 3D RI distribution. We experimentally demonstrate reconstruction of samples with varying amounts of multiple scattering: a 3T3 fibroblast cell, a cluster of C. elegans embryos, and a whole C. elegans worm, with lateral and axial resolutions of 250 nm and 900 nm, respectively.
The motion of electrons in or near solids, liquids and gases can be tracked by forcing their ejection with attosecond x-ray pulses, derived from femtosecond lasers. The momentum of these emitted electrons carries the imprint of the electronic state. Aberration corrected transmission electron microscopes have observed individual atoms, and have sufficient energy sensitivity to quantify atom bonding and electronic configurations. Recent developments in ultrafast electron microscopy and diffraction indicate that spatial and temporal information can be collected simultaneously. In the present work, we push the capability of femtosecond transmission electron microscopy (fs-TEM) towards that of the state of the art in ultrafast lasers and electron microscopes. This is anticipated to facilitate unprecedented elucidation of physical, chemical and biological structural dynamics on electronic time and length scales. The fs-TEM numerically studied employs a nanotip source, electrostatic acceleration to 70 keV, magnetic lens beam transport and focusing, a condenser-objective around the sample and a terahertz temporal compressor, including space charge effects during propagation. With electron emission equivalent to a 20 fs laser pulse, we find a spatial resolution below 10 nm and a temporal resolution of below 10 fs will be feasible for pulses comprised of on average 20 electrons. The influence of a transverse electric field at the sample is modelled, indicating that a field of 1 V/$mu$m can be resolved.
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