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This work presents a semi-analytical approach to answer the question of optimal beam filtering in the case of EDXRF measurements with an X-ray tube. A collection of programs, called xfilter, is presented that is capable to find the optimal filter material, the optimal filter thickness, and the optimal scattering angle, for all possible combinations of trace elements, target materials, and tube voltages. The concepts of the calculations are introduced in a general manner and demonstrated with a specific example, the detection of gold K_alpha1 XRF within human tissue. Comparing the calculation results and an EDXRF measurement shows excellent agreement.
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A hybrid pixel detector based on the concept of simultaneous charge integration and photon counting will be presented. The second generation of a counting and integrating X-ray prototype CMOS chip (CIX) has been operated with different direct converting sensor materials (CdZnTe and CdTe) bump bonded to its 8x8 pixel matrix. Photon counting devices give excellent results for low to medium X-ray fluxes but saturate at high rates while charge integration allows the detection of very high fluxes but is limited at low rates by the finite signal to noise ratio. The combination of both signal processing concepts therefore extends the resolvable dynamic range of the X-ray detector. In addition, for a large region of the dynamic range, where counter and integrator operate simultaneously, the mean energy of the detected X-ray spectrum can be calculated. This spectral information can be used to enhance the contrast of the X-ray image. The advantages of the counting and integrating signal processing concept and the performance of the imaging system will be reviewed. The properties of the system with respect to dynamic range and sensor response will be discussed and examples of imaging with additional spectral information will be presented.
The performance of hybrid GaAs pixel detectors as X-ray imaging sensors were investigated at room temperature. These hybrids consist of 300 mu-m thick GaAs pixel detectors, flip-chip bonded to a CMOS Single Photon Counting Chip (PCC). This chip consists of a matrix of 64 x 64 identical square pixels (170 mu-m x 170 mu-m) and covers a total area of 1.2 cm**2. The electronics in each cell comprises a preamplifier, a discriminator with a 3-bit threshold adjust and a 15-bit counter. The detector is realized by an array of Schottky diodes processed on semi-insulating LEC-GaAs bulk material. An IV-charcteristic and a detector bias voltage scan showed that the detector can be operated with voltages around 200 V. Images of various objects were taken by using a standard X-ray tube for dental diagnostics. The signal to noise ratio (SNR) was also determined. The applications of these imaging systems range from medical applications like digital mammography or dental X-ray diagnostics to non destructive material testing (NDT). Because of the separation of detector and readout chip, different materials can be investigated and compared.
We describe the concept of a new gamma ray scintronic detector targeting a time resolution of the order of 25 ps FWHM, with millimetric volume reconstruction and high detection efficiency. Its design consists of a monolithic large PbWO4 scintillating crystal with an efficient photocathode directly deposited on it. With an index of refraction higher for the photocathode than for the crystal, this design negates the total reflection effect of optical photons at the crystal/photo-detector optical interface, and thus largely improves optical coupling between the crystal and the photodetector. This allows to detect efficiently the Cherenkov light produced by 511 keV photoelectric
In this paper we present a new measurement setup, where a transitionedge sensor detector array is used to detect X-rays in particle induced X-ray emission measurements with a 2 MeV proton beam. Transition-edge sensors offer orders of magnitude improvement in energy resolution compared to conventional silicon or germanium detectors, making it possible to recognize spectral lines in materials analysis that have previously been impossible to resolve, and to get chemical information from the elements. Our sensors are cooled to the operation temperature (65 mK) with a cryogen-free adiabatic demagnetization refrigerator, which houses a specially designed X-ray snout that has a vacuum tight window to couple in the radiation. For the best pixel, the measured instrumental energy resolution was 3.06 eV full width at half maximum at 5.9 keV.We discuss the current status of the project, benefits of transition-edge sensors when used in particle induced X-ray emission spectroscopy, and the results from the first measurements.
Energy-dispersive X-ray diffraction (EDXRD) is extremely insensitive to sample morphology when implemented in a back-reflection geometry. The capabilities of this non-invasive technique for cultural heritage applications have been explored at high resolution at the Diamond Light Source synchrotron. The results of the XRD analysis of the pigments in 40 paints, commonly used by 20th century artists, are reported here. It was found that synthetic organic pigments yielded weak diffraction patterns at best, and it was not possible to unambiguously identify any of these pigments. In contrast, the majority of the paints containing inorganic pigments yielded good diffraction patterns amenable to crystallographic analysis. The high resolution of the technique enables the extraction of a range of detailed information: phase identification (including solid solutions), highly accurate unit cell parameters, phase quantification, crystallite size and strain parameters and preferred orientation parameters. The implications of these results for application to real paintings are discussed, along with the possibility to transfer the technique away from the synchrotron and into the laboratory and museum through the use of state-of-the-art microcalorimeter detectors. The results presented demonstrate the exciting potential of the technique for art history and authentication studies, based on the non-invasive acquisition of very high quality crystallographic data.
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