No Arabic abstract
A resistive memory device-based computing architecture is one of the promising platforms for energy-efficient Deep Neural Network (DNN) training accelerators. The key technical challenge in realizing such accelerators is to accumulate the gradient information without a bias. Unlike the digital numbers in software which can be assigned and accessed with desired accuracy, numbers stored in resistive memory devices can only be manipulated following the physics of the device, which can significantly limit the training performance. Therefore, additional techniques and algorithm-level remedies are required to achieve the best possible performance in resistive memory device-based accelerators. In this paper, we analyze asymmetric conductance modulation characteristics in RRAM by Soft-bound synapse model and present an in-depth analysis on the relationship between device characteristics and DNN model accuracy using a 3-layer DNN trained on the MNIST dataset. We show that the imbalance between up and down update leads to a poor network performance. We introduce a concept of symmetry point and propose a zero-shifting technique which can compensate imbalance by programming the reference device and changing the zero value point of the weight. By using this zero-shifting method, we show that network performance dramatically improves for imbalanced synapse devices.
In a previous work we have detailed the requirements to obtain a maximal performance benefit by implementing fully connected deep neural networks (DNN) in form of arrays of resistive devices for deep learning. This concept of Resistive Processing Unit (RPU) devices we extend here towards convolutional neural networks (CNNs). We show how to map the convolutional layers to RPU arrays such that the parallelism of the hardware can be fully utilized in all three cycles of the backpropagation algorithm. We find that the noise and bound limitations imposed due to analog nature of the computations performed on the arrays effect the training accuracy of the CNNs. Noise and bound management techniques are presented that mitigate these problems without introducing any additional complexity in the analog circuits and can be addressed by the digital circuits. In addition, we discuss digitally programmable update management and device variability reduction techniques that can be used selectively for some of the layers in a CNN. We show that combination of all those techniques enables a successful application of the RPU concept for training CNNs. The techniques discussed here are more general and can be applied beyond CNN architectures and therefore enables applicability of RPU approach for large class of neural network architectures.
Uncertainty plays a key role in real-time machine learning. As a significant shift from standard deep networks, which does not consider any uncertainty formulation during its training or inference, Bayesian deep networks are being currently investigated where the network is envisaged as an ensemble of plausible models learnt by the Bayes formulation in response to uncertainties in sensory data. Bayesian deep networks consider each synaptic weight as a sample drawn from a probability distribution with learnt mean and variance. This paper elaborates on a hardware design that exploits cycle-to-cycle variability of oxide based Resistive Random Access Memories (RRAMs) as a means to realize such a probabilistic sampling function, instead of viewing it as a disadvantage.
Resistive crossbars designed with non-volatile memory devices have emerged as promising building blocks for Deep Neural Network (DNN) hardware, due to their ability to compactly and efficiently realize vector-matrix multiplication (VMM), the dominant computational kernel in DNNs. However, a key challenge with resistive crossbars is that they suffer from a range of device and circuit level non-idealities such as interconnect parasitics, peripheral circuits, sneak paths, and process variations. These non-idealities can lead to errors in VMMs, eventually degrading the DNNs accuracy. It is therefore critical to study the impact of crossbar non-idealities on the accuracy of large-scale DNNs. However, this is challenging because existing device and circuit models are too slow to use in application-level evaluations. We present RxNN, a fast and accurate simulation framework to evaluate large-scale DNNs on resistive crossbar systems. RxNN splits and maps the computations involved in each DNN layer into crossbar operations, and evaluates them using a Fast Crossbar Model (FCM) that accurately captures the errors arising due to crossbar non-idealities while being four-to-five orders of magnitude faster than circuit simulation. FCM models a crossbar-based VMM operation using three stages - non-linear models for the input and output peripheral circuits (DACs and ADCs), and an equivalent non-ideal conductance matrix for the core crossbar array. We implement RxNN by extending the Caffe machine learning framework and use it to evaluate a suite of six large-scale DNNs developed for the ImageNet Challenge. Our experiments reveal that resistive crossbar non-idealities can lead to significant accuracy degradations (9.6%-32%) for these large-scale DNNs. To the best of our knowledge, this work is the first quantitative evaluation of the accuracy of large-scale DNNs on resistive crossbar based hardware.
Training of deep neural networks (DNNs) is a computationally intensive task and requires massive volumes of data transfer. Performing these operations with the conventional von Neumann architectures creates unmanageable time and power costs. Recent studies have shown that mixed-signal designs involving crossbar architectures are capable of achieving acceleration factors as high as 30,000x over the state of the art digital processors. These approaches involve utilization of non-volatile memory (NVM) elements as local processors. However, no technology has been developed to-date that can satisfy the strict device requirements for the unit cell. This paper presents the superconducting nanowire-based processing element as a cross-point device. The unit cell has many programmable non-volatile states that can be used to perform analog multiplication. Importantly, these states are intrinsically discrete due to quantization of flux, which provides symmetric switching characteristics. Operation of these devices in a crossbar is described and verified with electro-thermal circuit simulations. Finally, validation of the concept in an actual DNN training task is shown using an emulator.
The brain performs intelligent tasks with extremely low energy consumption. This work takes inspiration from two strategies used by the brain to achieve this energy efficiency: the absence of separation between computing and memory functions, and the reliance on low precision computation. The emergence of resistive memory technologies indeed provides an opportunity to co-integrate tightly logic and memory in hardware. In parallel, the recently proposed concept of Binarized Neural Network, where multiplications are replaced by exclusive NOR (XNOR) logic gates, offers a way to implement artificial intelligence using very low precision computation. In this work, we therefore propose a strategy to implement low energy Binarized Neural Networks, which employs brain-inspired concepts, while retaining energy benefits from digital electronics. We design, fabricate and test a memory array, including periphery and sensing circuits, optimized for this in-memory computing scheme. Our circuit employs hafnium oxide resistive memory integrated in the back end of line of a 130 nanometer CMOS process, in a two transistors - two resistors cell, which allows performing the exclusive NOR operations of the neural network directly within the sense amplifiers. We show, based on extensive electrical measurements, that our design allows reducing the amount of bit errors on the synaptic weights, without the use of formal error correcting codes. We design a whole system using this memory array. We show on standard machine learning tasks (MNIST, CIFAR-10, ImageNet and an ECG task) that the system has an inherent resilience to bit errors. We evidence that its energy consumption is attractive compared to more standard approaches, and that it can use the memory devices in regimes where they exhibit particularly low programming energy and high endurance.