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Scientific Opportunities with an X-ray Free-Electron Laser Oscillator

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 Publication date 2019
  fields Physics
and research's language is English




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An X-ray free-electron laser oscillator (XFELO) is a new type of hard X-ray source that would produce fully coherent pulses with meV bandwidth and stable intensity. The XFELO complements existing sources based on self-amplified spontaneous emission (SASE) from high-gain X-ray free-electron lasers (XFEL) that produce ultra-short pulses with broad-band chaotic spectra. This report is based on discussions of scientific opportunities enabled by an XFELO during a workshop held at SLAC on June 29 - July 1, 2016



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59 - G. Blaj , G. Carini , S. Carron 2017
Free-electron lasers (FELs) opened a new window on imaging the motion of atoms and molecules. At SLAC, FEL experiments are performed at LCLS using 120 Hz pulses with 10^12 to 10^13 photons in 10 fs (billions of times brighter than at the most powerful synchrotrons). Concurrently, users and staff operate under high pressure due to flexible and often rapidly changing setups and low tolerance for system malfunction. This extreme detection environment raises unique challenges, from obvious to surprising, and leads to treating detectors as consumables. We discuss in detail the detector damage mechanisms observed in 7 years of operation at LCLS, together with the corresponding damage mitigation strategies and their effectiveness. Main types of damage mechanisms already identified include: (1) x-ray radiation damage (from catastrophic to classical), (2) direct and indirect damage caused by optical lasers, (3) sample induced damage, (4) vacuum related damage, (5) high-pressure environment. In total, 19 damage mechanisms have been identified. We also present general strategies for reducing damage risk or minimizing the impact of detector damage on the science program. These include availability of replacement parts and skilled operators and also careful planning, incident investigation resulting in updated designs, procedures and operator training.
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The resolution function of a spectrometer based on a strongly bent single crystal (bending radius of 10 cm or less) is evaluated. It is shown that the resolution is controlled by two parameters, (i) the ratio of the lattice spacing of the chosen reflection to the crystal thickness and (ii) a single parameter comprising crystal thickness, its bending radius, and anisotropic elastic constants of the chosen crystal. Diamond, due to its unique elastic properties, can provide notably higher resolution than silicon. The results allow to optimize the parameters of bent crystal spectrometers for the hard X-ray free electron laser sources.
Resonant elastic X-ray scattering has been widely employed for exploring complex electronic ordering phenomena, like charge, spin, and orbital order, in particular in strongly correlated electronic systems. In addition, recent developments of pump-probe X-ray scattering allow us to expand the investigation of the temporal dynamics of such orders. Here, we introduce a new time-resolved Resonant Soft X-ray Scattering (tr-RSXS) endstation developed at the Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL). This endstation has an optical laser (wavelength of 800 nm plus harmonics) as the pump source. Based on the commissioning results, the tr-RSXS at PAL-XFEL can deliver a soft X-ray probe (400-1300 eV) with a time resolution about ~100 fs without jitter correction. As an example, the temporal dynamics of a charge density wave on a high-temperature cuprate superconductor is demonstrated.
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