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Register a new userFast Reflective Optic-Based Rotational Anisotropy Nonlinear Harmonic Generation Spectrometer
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We present a novel Rotational Anisotropy Nonlinear Harmonic Generation (RA-NHG) apparatus based primarily upon reflective optics. The data acquisition scheme used here allows for fast accumulation of RA-NHG traces, mitigating low frequency noise from laser drift, while permitting real-time adjustment of acquired signals with significantly more data points per unit angle rotation of the optics than other RA-NHG setups. We discuss the design and construction of the optical and electronic components of the device and present example data taken on a GaAs test sample at a variety of wavelengths. The RA-second harmonic generation data for this sample show the expected four-fold rotational symmetry across a broad range of wavelengths, while those for RA-third harmonic generation exhibit evidence of cascaded nonlinear processes possible in acentric crystal structures.
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We describe a novel scheme of detecting rotational anisotropy second harmonic generation (RA-SHG) signals using a lock-in amplifier referenced to a fast scanning RA-SHG apparatus. The method directly measures the $n^{th}$ harmonics of the scanning frequency corresponding to SHG signal components of $C_n$ symmetry that appear in a Fourier series expansion of a general RA-SHG signal. GaAs was used as a test sample allowing comparison of point-by-point averaging with the lock-in based method. When divided by the $C_infty$ signal component, the lock-in detected data allowed for both self-referenced determination of ratios of $C_n$ components of up to 1 part in 10$^4$ and significantly more sensitive measurement of the relative amount of different $C_n$ components when compared with conventional methods.
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