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Register a new userCharacterization of High Purity Germanium Point Contact Detectors with Low Net Impurity Concentration
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Susanne Mertens Dr.
Publication date
2018
fields
Physics
and research's language is
English
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High Purity germanium point-contact detectors have low energy thresholds and excellent energy resolution over a wide energy range, and are thus widely used in nuclear and particle physics. In rare event searches, such as neutrinoless double beta decay, the point-contact geometry is of particular importance since it allows for pulse-shape discrimination, and therefore for a significant background reduction. In this paper we investigate the pulse-shape discrimination performance of ultra-high purity germanium point contact detectors. It is demonstrated that a minimal net impurity concentration is required to meet the pulse-shape performance requirements.
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Large, high-purity, germanium (HPGe) detectors are needed for neutrinoless double-beta decay and dark matter experiments. Currently, large (> 4 inches in diameter) HPGe crystals can be grown at the University of South Dakota (USD). We verify that the quality of the grown crystals is sufficient for use in large detectors by fabricating and characterizing smaller HPGe detectors made from those crystals. We report the results from eight detectors fabricated over six months using crystals grown at USD. Amorphous germanium (a-Ge) contacts are used for blocking both electrons and holes. Two types of geometry were used to fabricate HPGe detectors. As a result, the fabrication process of small planar detectors at USD is discussed in great detail. The impact of the procedure and geometry on the detector performance was analyzed for eight detectors. We characterized the detectors by measuring the leakage current, capacitance, and energy resolution at 662 keV with a Cs-137 source. Four detectors show good performance, which indicates that crystals grown at USD are suitable for making HPGe detectors.
For the first time, planar high-purity germanium detectors with thin amorphous germanium contacts were successfully operated directly in liquid nitrogen and liquid argon in a cryostat at the Max-Planck-Institut fuer Physics in Munich. The detectors were fabricated at the Lawrence Berkeley National Laboratory and the University of South Dakota, using crystals grown at the University of South Dakota. They survived long-distance transportation and multiple thermal cycles in both cryogenic liquids and showed reasonable leakage currents and spectroscopic performance. Also discussed are the pros and cons of using thin amorphous semiconductor materials as an alternative contact technology in large-scale germanium experiments searching for physics beyond the Standard Model.
P-type point contact (PPC) germanium detectors are used in rare event and low-background searches, including neutrinoless double beta (0vbb) decay, low-energy nuclear recoils, and coherent elastic neutrino-nucleus scattering. The detectors feature an excellent energy resolution, low detection thresholds down to the sub-keV range, and enhanced background rejection capabilities. However, due to their large passivated surface, separating the signal readout contact from the bias voltage electrode, PPC detectors are susceptible to surface effects such as charge build-up. A profound understanding of their response to surface events is essential. In this work, the response of a PPC detector to alpha and beta particles hitting the passivated surface was investigated in a multi-purpose scanning test stand. It is shown that the passivated surface can accumulate charges resulting in a radial-dependent degradation of the observed event energy. In addition, it is demonstrated that the pulse shapes of surface alpha events show characteristic features which can be used to discriminate against these events.
A study of signals originating near the lithium-diffused n+ contact of p-type point contact (PPC) high purity germanium detectors (HPGe) is presented. The transition region between the active germanium and the fully dead layer of the n+ contact is examined. Energy depositions in this transition region are shown to result in partial charge collection. This provides a mechanism for events with a well defined energy to contribute to the continuum of the energy spectrum at lower energies. A novel technique to quantify the contribution from this source of background is introduced. Experiments that operate germanium detectors with a very low energy threshold may benefit from the methods presented herein.
The detection of low-energy deposition in the range of sub-eV through ionization using germanium (Ge) with a bandgap of $sim$0.7 eV requires internal amplification of charge signal. This can be achieved through high electric field which accelerates charge carriers to generate more charge carriers. The minimum electric field required to generate internal charge amplification is derived for different temperatures. A point contact Ge detector provides extremely high electric field in proximity to the point contact. We show the development of a planar point contact detector and its performance. The field distribution is calculated for this planar point contact detector. We demonstrate the required electric field can be achieved with a point contact detector.
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